Inventor · disambiguated record
Eojin Lee
Also filed as: LEE EOJIN
7 granted patents·4 pending applications·21 citations·filing 2020–2025
78Inventor score
Top patents by PatentIndex Score
11 records- 0194US11568917B1Hammer refresh row address detector, and semiconductor memory device and memory module including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jan 31, 2023·14 cites·20 claims
- 0287US12225702B2Dual port SRAM cell and method of designing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Feb 11, 2025·2 cites·19 claims
- 0384US11037618B2Row hammer prevention circuit, a memory module including the row hammer prevention circuit, and a memory system including the memory moduleSK HYNIX INC·Filed 2020·Granted Jun 15, 2021·3 cites·20 claims
- 0483US11139033B2Semiconductor memory device employing processing in memory (PIM) and operation method of the semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Oct 5, 2021·2 cites·18 claims
- 0569US11886985B2Method and apparatus with data processingSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jan 30, 2024·0 cites·19 claims
- 0664US11600340B2Semiconductor memory device employing processing in memory (PIM) and operation method of the semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Mar 7, 2023·0 cites·22 claims
- 0762US11436477B2Method and apparatus with data processingSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Sep 6, 2022·0 cites·20 claims
- 0859US2025336438A1Memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0957US2024243038A1Integrated circuit including back-side wiring and a method of designing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1056US2025227909A1Static random-access memory cellSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1154US2024365528A1Integrated circuit including backside wiresSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →