Inventor · disambiguated record
Ernest Allen, Iii
Also filed as: ALLEN ERNEST · ALLEN ERNEST E · ALLEN III ERNEST
12 granted patents·2 pending applications·311 citations·filing 1992–2013
93Inventor score
Top patents by PatentIndex Score
14 records- 0189US8796865B1RFID tags with bumped substrate, and apparatuses and methods for makingIMPINJ INC·Filed 2013·Granted Aug 5, 2014·9 cites·14 claims
- 0289US8122307B1One time programmable memory test structures and methodsLINDHORST CHAD A·Filed 2007·Granted Feb 21, 2012·27 cites·49 claims
- 0386US6939727B1Method for performing statistical post processing in semiconductor manufacturing using ID cellsLSI LOGIC CORP·Filed 2003·Granted Sep 6, 2005·49 cites·24 claims
- 0484US8614506B1RFID tags with bumped substrate, and apparatuses and methods for makingFASSETT JAY M·Filed 2008·Granted Dec 24, 2013·15 cites·31 claims
- 0580US7003421B1VDD over and undervoltage measurement techniques using monitor cellsLSI LOGIC CORP·Filed 2003·Granted Feb 21, 2006·25 cites·20 claims
- 0679US6629309B1Mask-programmable ROM cellLSI LOGIC CORP·Filed 2001·Granted Sep 30, 2003·28 cites·35 claims
- 0779US5218984AMeans and method for noise and cavitation attenuation in ball-type valvesALLEN ERNEST E·Filed 1992·Granted Jun 15, 1993·46 cites·20 claims
- 0870US5621312AMethod and apparatus for checking the integrity of a device tester-handler setupALTERA CORP·Filed 1995·Granted Apr 15, 1997·42 cites·24 claims
- 0968US5493519AHigh voltage driver circuit with fast current limiting for testing of integrated circuitsALTERA CORP·Filed 1993·Granted Feb 20, 1996·28 cites·9 claims
- 1065US5608337AMethod and apparatus of testing an integrated circuit deviceALTERA CORP·Filed 1995·Granted Mar 4, 1997·32 cites·33 claims
- 1158US7023230B1Method for testing IDD at multiple voltagesLSI LOGIC CORP·Filed 2003·Granted Apr 4, 2006·8 cites·20 claims
- 1234US2007218571A1Disabling poorly testing RFID ICsIMPINJ INC·Filed 2006·Application pending·0 cites
- 1330US2007220737A1Integrated circuit test result communicationSTOUGHTON ANTHONY·Filed 2006·Application pending·0 cites
- 1429US6134703AProcess for programming PLDs and embedded non-volatile memoriesLATTICE SEMICONDUCTOR CORP·Filed 1997·Granted Oct 17, 2000·2 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →