Inventor · disambiguated record
Ernst Biedermann
Also filed as: BIEDERMANN ERNST · RAPP HEINZ · WILDNER HORST
15 granted patents·269 citations·filing 1977–1996
94Inventor score
Top patents by PatentIndex Score
15 records- 0192US4364147AApparatus for removing particles of dust from the surfaces of flat objectsAGFA GEVAERT AG·Filed 1980·Granted Dec 21, 1982·55 cites·18 claims
- 0292US4218133APhotographic copying apparatusAGFA GEVAERT AG·Filed 1978·Granted Aug 19, 1980·24 cites·16 claims
- 0390US4218032AApparatus for convoluting webs onto rotary coresAGFA GEVAERT AG·Filed 1979·Granted Aug 19, 1980·25 cites·30 claims
- 0479US4647187APhotographic copierAGFA GEVAERT AG·Filed 1985·Granted Mar 3, 1987·17 cites·18 claims
- 0574US4175857APhotographic copying machineAGFA GEVAERT AG·Filed 1978·Granted Nov 27, 1979·10 cites·22 claims
- 0673US5644140AApparatus for checking semiconductor wafers with complementary light sources and two camerasSIEMENS AG·Filed 1995·Granted Jul 1, 1997·62 cites·11 claims
- 0772US4240744APhotographic copying machine with interchangeable format masksAGFA GEVAERT AG·Filed 1977·Granted Dec 23, 1980·9 cites·13 claims
- 0872US4194836APhotographic copying machine with carrier structure _carrying format masks to and away from the copying stationAGFA GEVAERT AG·Filed 1978·Granted Mar 25, 1980·8 cites·12 claims
- 0966US4214689AAutomatic counteracting of transverse shift of a longitudinally transported stripAGFA GEVAERT AG·Filed 1978·Granted Jul 29, 1980·14 cites·10 claims
- 1062US4444489AApparatus for influencing the color of copying light in photographic copying machines or the likeAGFA GEVAERT AG·Filed 1982·Granted Apr 24, 1984·7 cites·15 claims
- 1159US4390270APhotographic copierAGFA GEVAERT AG·Filed 1981·Granted Jun 28, 1983·6 cites·13 claims
- 1247US4353646AApparatus for positioning originals in photographic copying machinesAGFA GEVAERT AG·Filed 1981·Granted Oct 12, 1982·4 cites·25 claims
- 1346US4704026ACopying method and arrangement for difficult-to-copy originalsAGFA GEVAERT AG·Filed 1985·Granted Nov 3, 1987·5 cites·16 claims
- 1444US5825499AMethod for checking wafers having a lacquer layer for faultsSIEMENS AG·Filed 1996·Granted Oct 20, 1998·12 cites·10 claims
- 1534US5742395AMethod for checking semiconductor wafers and apparatuses for carrying out the methodSIEMENS AG·Filed 1995·Granted Apr 21, 1998·11 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →