Inventor · disambiguated record
Erik Essers
Also filed as: ESSERS ERIK
16 granted patents·4 pending applications·196 citations·filing 1999–2024
92Inventor score
Technology areasH01J
Files withZEISS CARL MICROSCOPY GMBH12CARL ZEISS MULTISEM GMBH3ZEISS CARL NTS GMBH2ESSERS ERIK1LEO ELEKTRONERMIKROSKOPIE GMBH1
Top patents by PatentIndex Score
20 records- 0194US10854423B2Multi-beam particle beam systemCARL ZEISS MULTISEM GMBH·Filed 2019·Granted Dec 1, 2020·31 cites·22 claims
- 0294US6590210B1Scanning electron microscopeFiled 1999·Granted Jul 8, 2003·119 cites·65 claims
- 0391US11276547B2Charged particle optical apparatus for through-the-lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2020·Granted Mar 15, 2022·2 cites·17 claims
- 0489US10068744B2Charged particle optical apparatus for through-the lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2015·Granted Sep 4, 2018·5 cites·11 claims
- 0588US9741528B2Charged particle optical apparatus having a selectively positionable differential pressure moduleZEISS CARL MICROSCOPY GMBH·Filed 2015·Granted Aug 22, 2017·6 cites·38 claims
- 0686US10522321B2Charged particle optical apparatus for through-the-lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2018·Granted Dec 31, 2019·3 cites·16 claims
- 0779US6707041B2Detector for a scanning electron microscope with variable pressure and scanning electron microscope with such detectorLEO ELEKTRONERMIKROSKOPIE GMBH·Filed 2002·Granted Mar 16, 2004·20 cites·45 claims
- 0867US11239054B2Multi-beam particle beam systemCARL ZEISS MULTISEM GMBH·Filed 2020·Granted Feb 1, 2022·0 cites·21 claims
- 0967US10861670B2Charged particle optical apparatus for through-the-lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted Dec 8, 2020·0 cites·36 claims
- 1064US8431894B2Electron beam deviceESSERS ERIK·Filed 2005·Granted Apr 30, 2013·2 cites·35 claims
- 1163US6949744B2Electron microscopy system, electron microscopy method and focusing system for charged particlesZEISS CARL NTS GMBH·Filed 2004·Granted Sep 27, 2005·5 cites·42 claims
- 1262US2024302542A1Particle beam microscopeZEISS CARL MICROSCOPY GMBH·Filed 2024·Application pending·0 cites
- 1362US2024304410A1Electron beam microscopeZEISS CARL MICROSCOPY GMBH·Filed 2024·Application pending·0 cites
- 1462US2024304412A1Particle beam microscopeZEISS CARL MICROSCOPY GMBH·Filed 2024·Application pending·0 cites
- 1562US2024304409A1Particle beam microscopeZEISS CARL MICROSCOPY GMBH·Filed 2024·Application pending·0 cites
- 1657US6969854B1Arrangement for holding a particle beam apparatusZEISS CARL NTS GMBH·Filed 2003·Granted Nov 29, 2005·3 cites·47 claims
- 1754US12300461B2Particle beam device, method for operating the particle beam device and computer program productZEISS CARL MICROSCOPY GMBH·Filed 2022·Granted May 13, 2025·0 cites·24 claims
- 1852US12362129B2Particle beam columnZEISS CARL MICROSCOPY GMBH·Filed 2022·Granted Jul 15, 2025·0 cites·24 claims
- 1952US12340973B2Particle beam system including a multi-beam deflection device and a beam stop, method for operating the particle beam system and associated computer program productCARL ZEISS MULTISEM GMBH·Filed 2022·Granted Jun 24, 2025·0 cites·20 claims
- 2051US10984977B2Particle beam system and method for operating a particle beam systemZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted Apr 20, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →