Inventor · disambiguated record
Eric M. Frey
Also filed as: FREY ERIC · FREY ERIC M
12 granted patents·204 citations·filing 1989–2019
91Inventor score
Top patents by PatentIndex Score
12 records- 0189US11262191B1On-axis dynamic interferometer and optical imaging systems employing the sameONTO INNOVATION INC·Filed 2019·Granted Mar 1, 2022·5 cites·24 claims
- 0284US5173605ACompact temperature-compensated tube-type scanning probe with large scan range and independent x, y, and z controlWYKO CORP·Filed 1992·Granted Dec 22, 1992·49 cites·16 claims
- 0381US7479316B2Extruded binary sealDAYCO PRODUCTS LLC·Filed 2005·Granted Jan 20, 2009·6 cites·13 claims
- 0479US5483064APositioning mechanism and method for providing coaxial alignment of a probe and a scanning means in scanning tunneling and scanning force microscopyWYKO CORP·Filed 1994·Granted Jan 9, 1996·66 cites·12 claims
- 0574US7552520B2Extruded seal having a corrugated axial surface, a method of manufacturing such seals, and a method of using such sealsDAYCO PRODUCTS LLC·Filed 2005·Granted Jun 30, 2009·7 cites·22 claims
- 0660US5023848ASolder wave dwell timerHIGHES AIRCRAFT COMPANY·Filed 1989·Granted Jun 11, 1991·18 cites·6 claims
- 0758US5103094ACompact temperature-compensated tube-type scanning probe with large scan rangeWYKO CORP·Filed 1991·Granted Apr 7, 1992·20 cites·20 claims
- 0856US8119046B2Multilayer extruded seal and method for manufacturing such sealDUKE JEREMY·Filed 2008·Granted Feb 21, 2012·0 cites·20 claims
- 0955US5844675AInterchangeable sample stage with integral reference surface for magnetic-head suspension measuring instrumentWYKO CORP·Filed 1997·Granted Dec 1, 1998·11 cites·16 claims
- 1052US5200617APMN translator and linearization system in scanning probe microscopeWYKO CORP·Filed 1992·Granted Apr 6, 1993·12 cites·5 claims
- 1135US5044312AConformal coat contact insertion strip maskHUGHES AIRCRAFT CO·Filed 1989·Granted Sep 3, 1991·5 cites·13 claims
- 1234US4911046AHybrid lead trim dieHUGHES AIRCRAFT CO·Filed 1989·Granted Mar 27, 1990·5 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →