Inventor · disambiguated record
Erik L. Hedberg
Also filed as: HEDBERG ERIK · HEDBERG ERIK L · HEDBERG ERIK LEIGH
45 granted patents·5 pending applications·3,776 citations·filing 1991–2025
99Inventor score
Top patents by PatentIndex Score
50 records- 0199US5502333ASemiconductor stack structures and fabrication/sparing methods utilizing programmable spare circuitIBM·Filed 1994·Granted Mar 26, 1996·389 cites·25 claims
- 0297US5561622AIntegrated memory cube structureIBM·Filed 1993·Granted Oct 1, 1996·250 cites·29 claims
- 0396US5870350AHigh performance, high bandwidth memory bus architecture utilizing SDRAMsIBM·Filed 1997·Granted Feb 9, 1999·317 cites·12 claims
- 0496US5563086AIntegrated memory cube, structure and fabricationIBM·Filed 1995·Granted Oct 8, 1996·195 cites·14 claims
- 0596US5502667AIntegrated multichip memory module structureIBM·Filed 1993·Granted Mar 26, 1996·291 cites·26 claims
- 0695US6233184B1Structures for wafer level test and burn-inIBM·Filed 1998·Granted May 15, 2001·102 cites·44 claims
- 0795US5859804AMethod and apparatus for real time two dimensional redundancy allocationIBM·Filed 1997·Granted Jan 12, 1999·119 cites·4 claims
- 0895US5807791AMethods for fabricating multichip semiconductor structures with consolidated circuitry and programmable ESD protection for input/output nodesIBM·Filed 1997·Granted Sep 15, 1998·158 cites·12 claims
- 0994US6396120B1Silicon anti-fuse structures, bulk and silicon on insulator fabrication methods and applicationIBM·Filed 2000·Granted May 28, 2002·84 cites·26 claims
- 1094US6141245AImpedance control using fusesIBM·Filed 1999·Granted Oct 31, 2000·142 cites·31 claims
- 1194US5702984AIntegrated mulitchip memory module, structure and fabricationIBM·Filed 1996·Granted Dec 30, 1997·163 cites·20 claims
- 1294US5446695AMemory device with programmable self-refreshing and testing methods thereforeIBM·Filed 1994·Granted Aug 29, 1995·119 cites·14 claims
- 1393US6518112B2High performance, low power vertical integrated CMOS devicesIBM·Filed 2001·Granted Feb 11, 2003·67 cites·22 claims
- 1493US6255899B1Method and apparatus for increasing interchip communications ratesIBM·Filed 1999·Granted Jul 3, 2001·136 cites·34 claims
- 1592US6426904B2Structures for wafer level test and burn-inIBM·Filed 2001·Granted Jul 30, 2002·43 cites·30 claims
- 1691US5946545ASemiconductor stack structures and fabrication/sparing methods utilizing programmable spare circuitIBM·Filed 1997·Granted Aug 31, 1999·98 cites·9 claims
- 1789US6297531B2High performance, low power vertical integrated CMOS devicesIBM·Filed 1998·Granted Oct 2, 2001·73 cites·33 claims
- 1889US6239649B1Switched body SOI (silicon on insulator) circuits and fabrication method thereforIBM·Filed 1999·Granted May 29, 2001·78 cites·10 claims
- 1989US5703823AMemory device with programmable self-refreshing and testing methods thereforeIBM·Filed 1995·Granted Dec 30, 1997·74 cites·20 claims
- 2087US6243283B1Impedance control using fusesIBM·Filed 2000·Granted Jun 5, 2001·42 cites·4 claims
- 2187US5896404AProgrammable burst length DRAMIBM·Filed 1997·Granted Apr 20, 1999·130 cites·9 claims
- 2286US6574763B1Method and apparatus for semiconductor integrated circuit testing and burn-inIBM·Filed 1999·Granted Jun 3, 2003·61 cites·23 claims
- 2386US6388305B1Electrically programmable antifuses and methods for forming the sameIBM·Filed 1999·Granted May 14, 2002·78 cites·22 claims
- 2486US6026505AMethod and apparatus for real time two dimensional redundancy allocationIBM·Filed 1991·Granted Feb 15, 2000·55 cites·11 claims
- 2583US6633055B2Electronic fuse structure and method of manufacturingIBM·Filed 1999·Granted Oct 14, 2003·69 cites·8 claims
- 2682US6219215B1Chip thermal protection deviceIBM·Filed 1999·Granted Apr 17, 2001·65 cites·10 claims
- 2775US6070262AReconfigurable I/O DRAMIBM·Filed 1997·Granted May 30, 2000·36 cites·16 claims
- 2872US8024513B2Method and system for implementing dynamic refresh protocols for DRAM based cacheIBM·Filed 2007·Granted Sep 20, 2011·5 cites·20 claims
- 2972US6178517B1High bandwidth DRAM with low operating power modesIBM·Filed 1998·Granted Jan 23, 2001·60 cites·11 claims
- 3071US7701035B2Laser fuse structures for high power applicationsIBM·Filed 2005·Granted Apr 20, 2010·5 cites·14 claims
- 3171US6812122B2Method for forming a voltage programming elementIBM·Filed 2002·Granted Nov 2, 2004·16 cites·7 claims
- 3271US6567950B1Dynamically replacing a failed chipIBM·Filed 1999·Granted May 20, 2003·31 cites·16 claims
- 3371US6177807B1High frequency valid data strobeIBM·Filed 1999·Granted Jan 23, 2001·55 cites·6 claims
- 3467US5604755AMemory system reset circuitIBM·Filed 1995·Granted Feb 18, 1997·50 cites·14 claims
- 3566US6137129AHigh performance direct coupled FET memory cellIBM·Filed 1998·Granted Oct 24, 2000·27 cites·23 claims
- 3665US8108609B2Structure for implementing dynamic refresh protocols for DRAM based cacheBARTH JOHN E·Filed 2008·Granted Jan 31, 2012·5 cites·10 claims
- 3763US2025363784A1Computer-implemented method for training of an image content recognition algorithmSICK IVP AB·Filed 2025·Application pending·0 cites
- 3862US7300825B2Customizing back end of the line interconnectsIBM·Filed 2004·Granted Nov 27, 2007·10 cites·27 claims
- 3962US5798282ASemiconductor stack structures and fabrication sparing methods utilizing programmable spare circuitIBM·Filed 1995·Granted Aug 25, 1998·22 cites·13 claims
- 4060US5898623AInput port switching protocol for a random access memoryIBM·Filed 1997·Granted Apr 27, 1999·18 cites·13 claims
- 4151US6426530B1High performance direct coupled FET memory cellIBM·Filed 2000·Granted Jul 30, 2002·8 cites·10 claims
- 4249US6570254B1Electrical mask identification of memory modulesIBM·Filed 2001·Granted May 27, 2003·2 cites·13 claims
- 4348US2009144504A1STRUCTURE FOR IMPLEMENTING REFRESHLESS SINGLE TRANSISTOR CELL eDRAM FOR HIGH PERFORMANCE MEMORY APPLICATIONSIBM·Filed 2008·Application pending·0 cites
- 4447US6065093AHigh bandwidth narrow I/O memory device with command stackingIBM·Filed 1998·Granted May 16, 2000·10 cites·9 claims
- 4547US2009144507A1APPARATUS AND METHOD FOR IMPLEMENTING REFRESHLESS SINGLE TRANSISTOR CELL eDRAM FOR HIGH PERFORMANCE MEMORY APPLICATIONSIBM·Filed 2007·Application pending·0 cites
- 4642US6255208B1Selective wafer-level testing and burn-inIBM·Filed 1999·Granted Jul 3, 2001·10 cites·18 claims
- 4742US2019013062A1Selective refresh mechanism for dramQUALCOMM INC·Filed 2017·Application pending·0 cites
- 4836US5969997ANarrow data width DRAM with low latency page-hit operationsIBM·Filed 1997·Granted Oct 19, 1999·8 cites·17 claims
- 4933US2018137929A1Wear sensor and method of operation for a memory deviceQUALCOMM INC·Filed 2016·Application pending·0 cites
- 5027US6268228B1Electrical mask identification of memory modulesIBM·Filed 1999·Granted Jul 31, 2001·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →