Inventor · disambiguated record
Eric Jacob Jan Kirchner
Also filed as: KIRCHNER ERIC · KIRCHNER ERIC J · KIRCHNER ERIC JACOB JAN
17 granted patents·402 citations·filing 1997–2023
94Inventor score
Files withLSI LOGIC CORP9AKZO NOBEL COATINGS INT BV4KIRCHNER ERIC JACOB JAN2BENOIT MERLE1SHOUP MFG CO INC1
Top patents by PatentIndex Score
17 records- 0191US6692338B1Through-pad drainage of slurry during chemical mechanical polishingLSI LOGIC CORP·Filed 1997·Granted Feb 17, 2004·118 cites·28 claims
- 0290US5888121AControlling groove dimensions for enhanced slurry flowLSI LOGIC CORP·Filed 1997·Granted Mar 30, 1999·95 cites·28 claims
- 0384US11900507B2Visualizing wood stainingAKZO NOBEL COATINGS INT BV·Filed 2020·Granted Feb 13, 2024·2 cites·17 claims
- 0481US5835226AMethod for determining optical constants prior to film processing to be used improve accuracy of post-processing thickness measurementsLSI LOGIC CORP·Filed 1997·Granted Nov 10, 1998·52 cites·14 claims
- 0577US6093280AChemical-mechanical polishing pad conditioning systemsLSI LOGIC CORP·Filed 1997·Granted Jul 25, 2000·50 cites·34 claims
- 0674US7804597B2Method for matching paintAKZO NOBEL COATINGS INT BV·Filed 2005·Granted Sep 28, 2010·9 cites·5 claims
- 0769US5913715AUse of hydrofluoric acid for effective pad conditioningLSI LOGIC CORP·Filed 1997·Granted Jun 22, 1999·30 cites·20 claims
- 0867US10375148B2Colour variant selection method using a mobile deviceAKZO NOBEL COATINGS INT BV·Filed 2012·Granted Aug 6, 2019·4 cites·20 claims
- 0965US8979106B2Tire protection mountBENOIT MERLE·Filed 2013·Granted Mar 17, 2015·7 cites·6 claims
- 1065US6254456B1Modifying contact areas of a polishing pad to promote uniform removal ratesLSI LOGIC CORP·Filed 1997·Granted Jul 3, 2001·26 cites·10 claims
- 1158US9135886B2Colour calibration of electronic display screensKIRCHNER ERIC JACOB JAN·Filed 2011·Granted Sep 15, 2015·1 cites·20 claims
- 1255US9791318B2Display of effect coatings on electronic display devicesKIRCHNER ERIC JACOB JAN·Filed 2010·Granted Oct 17, 2017·2 cites·18 claims
- 1352US6964924B1Integrated circuit process monitoring and metrology systemLSI LOGIC CORP·Filed 2001·Granted Nov 15, 2005·3 cites·8 claims
- 1449US12345570B2Method for matching a coating of any gloss levelAKZO NOBEL COATINGS INT BV·Filed 2023·Granted Jul 1, 2025·0 cites·16 claims
- 1547US7115425B2Integrated circuit process monitoring and metrology systemLSI LOGIC CORP·Filed 2005·Granted Oct 3, 2006·0 cites·6 claims
- 1635US6472316B1Photolithography overlay controlLSI LOGIC CORP·Filed 2001·Granted Oct 29, 2002·0 cites·20 claims
- 1729USD742938STire protection mountSHOUP MFG CO INC·Filed 2012·Granted Nov 10, 2015·3 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →