Inventor · disambiguated record
Erik A. Nelson
Also filed as: NELSON ERIK · NELSON ERIK A · NELSON ERIK ARTHUR
10 granted patents·2 pending applications·163 citations·filing 2000–2025
91Inventor score
Top patents by PatentIndex Score
12 records- 0184US8854073B2Methods and apparatus for margin testing integrated circuits using asynchronously timed varied supply voltage and test patternsGROSCH DAVID A·Filed 2011·Granted Oct 7, 2014·9 cites·25 claims
- 0284US6856569B2Method and system for merging multiple fuse decompression serial bitstreams to support auxiliary fuseblow capabilityIBM·Filed 2003·Granted Feb 15, 2005·35 cites·26 claims
- 0377US6577548B1Self timing interlock circuit for embedded DRAMIBM·Filed 2002·Granted Jun 10, 2003·25 cites·20 claims
- 0471US7103814B2Testing logic and embedded memory in parallelIBM·Filed 2002·Granted Sep 5, 2006·16 cites·12 claims
- 0571US6658604B1Method for testing and guaranteeing that skew between two signals meets predetermined criteriaIBM·Filed 2000·Granted Dec 2, 2003·16 cites·26 claims
- 0670US6449200B1Duty-cycle-efficient SRAM cell testIBM·Filed 2001·Granted Sep 10, 2002·18 cites·33 claims
- 0769US7073100B2Method for testing embedded DRAM arraysIBM·Filed 2002·Granted Jul 4, 2006·16 cites·10 claims
- 0867US8125840B2Reference level generation with offset compensation for sense amplifierBARTH JR JOHN E·Filed 2009·Granted Feb 28, 2012·6 cites·21 claims
- 0962US6708298B2Method for guaranteeing a minimum data strobe valid window and a minimum data valid window for DDR memory devicesIBM·Filed 2001·Granted Mar 16, 2004·13 cites·19 claims
- 1061US2025378575A1Tracking Occluded Objects in HandAPPLE INC·Filed 2025·Application pending·0 cites
- 1158US7237165B2Method for testing embedded DRAM arraysIBM·Filed 2004·Granted Jun 26, 2007·9 cites·18 claims
- 1258US2025377742A1Controller engagement detection using hybrid sensor approachAPPLE INC·Filed 2025·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →