Inventor · disambiguated record
Erik Novak
Also filed as: NOVAK ERIK · NOVAK ERIK L
14 granted patents·1 pending application·107 citations·filing 1995–2016
90Inventor score
Top patents by PatentIndex Score
15 records- 0186US7119909B2Film thickness and boundary characterization by interferometric profilometryVEECO INSTR INC·Filed 2004·Granted Oct 10, 2006·39 cites·29 claims
- 0280US9752868B2Optical measurement of lead angle of groove in manufactured partNOVAK ERIK·Filed 2016·Granted Sep 5, 2017·3 cites·27 claims
- 0371US9234814B1Automated re-focusing of interferometric reference mirrorNOVAK ERIK·Filed 2013·Granted Jan 12, 2016·3 cites·12 claims
- 0471US5633715ACentroid approach for estimating modulation peak in broad-bandwidth interferometryWYKO CORP·Filed 1995·Granted May 27, 1997·38 cites·17 claims
- 0567US7654685B2Variable-wavelength illumination system for interferometryVEECO INSTR INC·Filed 2007·Granted Feb 2, 2010·6 cites·20 claims
- 0665US8953171B1Signal sectioning for profiling printed-circuit-board vias with vertical scanning interferometrySCHMIT JOANNA·Filed 2012·Granted Feb 10, 2015·2 cites·14 claims
- 0761US7283250B2Measurement of object deformation with optical profilerVEECO INSTR INC·Filed 2004·Granted Oct 16, 2007·10 cites·18 claims
- 0859US8482741B2Interferometric measurement of non-homogeneous multi-material surfacesCHEN DONG·Filed 2012·Granted Jul 9, 2013·1 cites·4 claims
- 0956US8213021B2Interferometric measurement of non-homogeneous multi-material surfacesCHEN DONG·Filed 2007·Granted Jul 3, 2012·2 cites·21 claims
- 1053US9664509B2Signal sectioning for profiling printed-circuit-bord vias with vertical scanning interferometryBRUKER NANO INC·Filed 2014·Granted May 30, 2017·0 cites·6 claims
- 1153US7212356B2Mounting mechanism for compensating optics in interferometerVEECO INSTR INC·Filed 2005·Granted May 1, 2007·2 cites·22 claims
- 1247US7808652B2Interferometric measurement of DLC layer on magnetic headVEECO INSTR INC·Filed 2008·Granted Oct 5, 2010·1 cites·21 claims
- 1345US9664501B2Automated re-focusing of interferometric reference mirrorBRUKE NANO INC·Filed 2016·Granted May 30, 2017·0 cites·9 claims
- 1443US8416425B2Interferometric measurement of non-homogeneous multi-material surfacesMUNTEANU FLORIN·Filed 2012·Granted Apr 9, 2013·0 cites·5 claims
- 1534US2012105864A1Optical measurement of lead angle of groove in manufactured partNOVAK ERIK·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →