Inventor · disambiguated record
Eric J. Stave
Also filed as: STAVE ERIC · STAVE ERIC J
47 granted patents·8 pending applications·319 citations·filing 1997–2025
98Inventor score
Top patents by PatentIndex Score
55 records- 0188US11568913B2Voltage adjustment based on pending refresh operationsMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 31, 2023·2 cites·21 claims
- 0288US10424356B2Methods for on-die memory termination and memory devices and systems employing the sameMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 24, 2019·6 cites·25 claims
- 0383US11416437B2Memory devices, modules and systems having memory devices with varying physical dimensions, memory formats, and operational capabilitiesMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 16, 2022·2 cites·23 claims
- 0482US11545199B2Methods for on-die memory termination and memory devices and systems employing the sameMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 3, 2023·1 cites·20 claims
- 0581US11728001B2Apparatuses for characterizing system channels and associated methods and systemsMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 15, 2023·2 cites·18 claims
- 0681US2025232798A1Apparatus with data-rate-based voltage control mechanism and methods for operating the sameLODESTAR LICENSING GROUP LLC·Filed 2025·Application pending·0 cites
- 0780US5734198AMulti-layer lead frame for a semiconductor deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 31, 1998·64 cites·19 claims
- 0879US12277963B2Apparatus with data-rate-based voltage control mechanism and methods for operating the sameLODESTAR LICENSING GROUP LLC·Filed 2024·Granted Apr 15, 2025·0 cites·19 claims
- 0979US11031070B1Apparatus and method for performing continuous time linear equalization on a command/address signalMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 8, 2021·2 cites·20 claims
- 1078US6002623ASemiconductor memory with test circuitMICRON TECHNOLOGY INC·Filed 1999·Granted Dec 14, 1999·39 cites·23 claims
- 1176US11217284B2Memory with per pin input/output termination and driver impedance calibrationMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 4, 2022·1 cites·20 claims
- 1276US11080219B1Addressing scheme for a memory systemMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 3, 2021·1 cites·20 claims
- 1375US11948661B2Methods for tuning command/address bus timing and memory devices and memory systems using the sameMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 2, 2024·1 cites·45 claims
- 1475US2024111707A1Memory devices, modules and systems having memory devices with varying physical dimensions, memory formats, and operational capabilitiesLODESTAR LICENSING GROUP LLC·Filed 2023·Application pending·0 cites
- 1574US11881245B2Apparatus with data-rate-based voltage control mechanism and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2022·Granted Jan 23, 2024·0 cites·20 claims
- 1673US11789890B2Memory devices, modules and systems having memory devices with varying physical dimensions, memory formats, and operational capabilitiesLODESTAR LICENSING GROUP LLC·Filed 2022·Granted Oct 17, 2023·0 cites·21 claims
- 1773US11003386B2Methods for on-die memory termination and memory devices and systems employing the sameMICRON TECHNOLOGY INC·Filed 2018·Granted May 11, 2021·1 cites·16 claims
- 1873US6154078ASemiconductor buffer circuit with a transition delay circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 28, 2000·19 cites·11 claims
- 1971US7664999B2Real time testing using on die termination (ODT) circuitMICRON TECHNOLOGY INC·Filed 2006·Granted Feb 16, 2010·6 cites·18 claims
- 2071US6438043B2Adjustable I/O timing from externally applied voltageMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 20, 2002·51 cites·26 claims
- 2169US6515353B2Multi-layer lead frame for a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 4, 2003·11 cites·13 claims
- 2269US6307255B1Multi-layer lead frame for a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 23, 2001·11 cites·15 claims
- 2367US12112830B2Methods for memory power management and memory devices and systems employing the sameLODESTAR LICENSING GROUP LLC·Filed 2022·Granted Oct 8, 2024·0 cites·18 claims
- 2467US11462254B2Apparatus with data-rate-based voltage control mechanism and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 4, 2022·0 cites·20 claims
- 2567US10950282B2Methods for on-die memory termination and memory devices and systems employing the sameMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 16, 2021·1 cites·16 claims
- 2667US7167401B2Low power chip select (CS) latency optionMICRON TECHNOLOGY INC·Filed 2005·Granted Jan 23, 2007·5 cites·15 claims
- 2766US11867726B2Methods for triggering oscilloscopes and oscilloscopes employing the sameMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 9, 2024·0 cites·23 claims
- 2866US11586386B2Methods for on-die memory termination and memory devices and systems employing the sameMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 21, 2023·0 cites·20 claims
- 2966US5684809ASemiconductor memory with test circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 4, 1997·24 cites·23 claims
- 3065US6788126B2Semiconductor buffer circuit with a transition delay circuitMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 7, 2004·8 cites·31 claims
- 3163US11494323B2Addressing scheme for a memory systemMICRON TECHNOLOGY INC·Filed 2021·Granted Nov 8, 2022·0 cites·20 claims
- 3263US6166576AMethod and apparatus for controlling timing of digital componentsMICRON TECHNOLOGY INC·Filed 1998·Granted Dec 26, 2000·18 cites·30 claims
- 3360US9122570B2Data pattern generation for I/O training and characterizationNANYA TECHNOLOGY CORP·Filed 2013·Granted Sep 1, 2015·2 cites·14 claims
- 3460US2024268131A1Optical signaling for stacked memory device architecturesMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 3559US7274606B2Low power chip select (CS) latency optionMICRON TECHNOLOGY INC·Filed 2006·Granted Sep 25, 2007·3 cites·13 claims
- 3658US11977751B2On-die termination configuration for a memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted May 7, 2024·0 cites·20 claims
- 3758US2024314990A1On die clock jitter injection for electromagnetic interference reductionMICRON TECHNOLOGY INC·Filed 2023·Application pending·0 cites
- 3856US11393513B2Timing of read and write operations to reduce interference, and related devices, systems, and methodsMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 19, 2022·0 cites·20 claims
- 3956US2025266079A1Apparatuses and methods for dq terminal pseudo-random bit stream variationMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 4053US6707312B2Pseudo variable resistor for tester platformMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 16, 2004·5 cites·8 claims
- 4153US6278310B1Semiconductor buffer circuit with a transition delay circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 21, 2001·4 cites·26 claims
- 4252US12512179B2Interposers for memory device testing and characterization, including interposers for testing and characterizing decision feedback equalization circuitry of DDR5 memory devicesMICRON TECHNOLOGY INC·Filed 2023·Granted Dec 30, 2025·0 cites·20 claims
- 4352US12068751B2Systems and techniques for jitter reductionMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 20, 2024·0 cites·19 claims
- 4452US12051478B2Test devices having parallel impedances to reduce measurement input impedance and related apparatuses, systems, and methodsMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 30, 2024·0 cites·20 claims
- 4551US2025165340A1Self-adaptation of dram command/address interfaceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 4649US11508422B2Methods for memory power management and memory devices and systems employing the sameMICRON TECHNOLOGY INC·Filed 2019·Granted Nov 22, 2022·0 cites·13 claims
- 4749US6124630AMulti-layer lead frame for a semiconductor deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 26, 2000·10 cites·15 claims
- 4848US7574634B2Real time testing using on die termination (ODT) circuitMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 11, 2009·4 cites·28 claims
- 4948US2024420790A1Self-calibration in a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 5046US6515529B2Semiconductor buffer circuit with a transition delay circuitMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 4, 2003·2 cites·32 claims
Showing the top 50 of 55 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →