Inventor · disambiguated record
Eric T. Stubbs
Also filed as: STUBBS ERIC · STUBBS ERIC T
39 granted patents·716 citations·filing 1996–2006
98Inventor score
Files withMICRON TECHNOLOGY INC39
Top patents by PatentIndex Score
39 records- 0196US6727739B2Compensation for a delay locked loopMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 27, 2004·60 cites·28 claims
- 0294US6947341B2Integrated semiconductor memory chip with presence detect data capabilityMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 20, 2005·74 cites·10 claims
- 0394US6388480B1Method and apparatus for reducing the lock time of DLLMICRON TECHNOLOGY INC·Filed 2000·Granted May 14, 2002·87 cites·47 claims
- 0492US6636093B1Compensation for a delay locked loopMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 21, 2003·55 cites·29 claims
- 0589US6791381B2Method and apparatus for reducing the lock time of a DLLMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 14, 2004·49 cites·26 claims
- 0689US6286115B1On-chip testing circuit and method for integrated circuitsMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 4, 2001·69 cites·59 claims
- 0783US6959062B1Variable delay lineMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 25, 2005·31 cites·51 claims
- 0881US6570258B2Method for reducing capacitive coupling between conductive linesMICRON TECHNOLOGY INC·Filed 2001·Granted May 27, 2003·25 cites·9 claims
- 0980US6862224B2System and method for operating a memory arrayMICRON TECHNOLOGY INC·Filed 2003·Granted Mar 1, 2005·23 cites·10 claims
- 1078US6028799AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 22, 2000·17 cites·7 claims
- 1177US6838712B2Per-bit set-up and hold time adjustment for double-data rate synchronous DRAMMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 4, 2005·19 cites·14 claims
- 1276US7274605B2Per-bit set-up and hold time adjustment for double-data rate synchronous DRAMMICRON TECHNOLOGY INC·Filed 2006·Granted Sep 25, 2007·7 cites·19 claims
- 1376US5877993AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 2, 1999·16 cites·12 claims
- 1471US7116589B2Per-bit set-up and hold time adjustment for double-data rate synchronous DRAMMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 3, 2006·13 cites·86 claims
- 1571US5787096ACircuit and method for testing an integrated circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Jul 28, 1998·26 cites·20 claims
- 1670US6581174B2On-chip testing circuit and method for integrated circuitsMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 17, 2003·15 cites·35 claims
- 1769US6778452B2Circuit and method for voltage regulation in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 17, 2004·6 cites·10 claims
- 1868US5923672AMultipath antifuse circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 13, 1999·27 cites·27 claims
- 1967US5936974ACircuit and method for testing an integrated circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Aug 10, 1999·22 cites·15 claims
- 2062US7152143B2Integrated semiconductor memory chip with presence detect data capabilityMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 19, 2006·6 cites·15 claims
- 2161US6011731ACell plate regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Jan 4, 2000·7 cites·16 claims
- 2258US6052322AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 18, 2000·6 cites·5 claims
- 2356US5854128AMethod for reducing capacitive coupling between conductive linesMICRON TECHNOLOGY INC·Filed 1996·Granted Dec 29, 1998·17 cites·15 claims
- 2454US6625692B1Integrated semiconductor memory chip with presence detect data capabilityMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 23, 2003·20 cites·33 claims
- 2552US6181617B1Method and apparatus for testing a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 30, 2001·2 cites·4 claims
- 2649US6898144B2Actively driven VREF for input buffer noise immunityMICRON TECHNOLOGY INC·Filed 2003·Granted May 24, 2005·4 cites·8 claims
- 2749US6597619B2Actively driven VREF for input buffer noise immunityMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 22, 2003·4 cites·34 claims
- 2846US6188622B1Method of identifying a defect within a memory circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 13, 2001·1 cites·4 claims
- 2946US5982687AMethod of detecting leakage within a memory cell capacitorMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 9, 1999·3 cites·5 claims
- 3040US7400544B2Actively driven VREF for input buffer noise immunityMICRON TECHNOLOGY INC·Filed 2005·Granted Jul 15, 2008·0 cites·2 claims
- 3140US6882587B2Method of preparing to test a capacitorMICRON TECHNOLOGY INC·Filed 2004·Granted Apr 19, 2005·0 cites·5 claims
- 3239US6600687B2Method of compensating for a defect within a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 29, 2003·0 cites·1 claims
- 3338US6469944B2Method of compensating for a defect within a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 22, 2002·0 cites·4 claims
- 3438US6445629B2Method of stressing a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 3, 2002·0 cites·1 claims
- 3538US6418071B2Method of testing a memory cellMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 9, 2002·0 cites·2 claims
- 3638US6353564B1Method of testing a memory arrayMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 5, 2002·0 cites·5 claims
- 3738US6226210B1Method of detecting a short from a digit line pair to groundMICRON TECHNOLOGY INC·Filed 2000·Granted May 1, 2001·0 cites·5 claims
- 3837US6259162B1Method for reducing capactive coupling between conductive linesMICRON TECHNOLOGY INC·Filed 1998·Granted Jul 10, 2001·5 cites·11 claims
- 3934US6667911B2High speed memory architectureMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 23, 2003·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →