Inventor · disambiguated record
Erwin Thalmann
Also filed as: THALMANN ERWIN
18 granted patents·8 pending applications·50 citations·filing 2002–2016
91Inventor score
Top patents by PatentIndex Score
26 records- 0164US7321497B2Electronic circuit apparatus and method for stacking electronic circuit unitsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 22, 2008·3 cites·19 claims
- 0264US7184335B2Electronic memory apparatus, and method for deactivating redundant bit lines or word linesINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 27, 2007·6 cites·7 claims
- 0361US7276896B2Test apparatus and method for testing circuit units to be testedINFINEON TECHNOLOGIES AG·Filed 2005·Granted Oct 2, 2007·4 cites·13 claims
- 0460US6897646B2Method for testing wafers to be tested and calibration apparatusINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 24, 2005·11 cites·10 claims
- 0560US6882139B2Electronic component, tester device and method for calibrating a tester deviceINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 19, 2005·11 cites·22 claims
- 0653US10018667B2Method for testing semiconductor diesINFINEON TECHNOLOGIES AG·Filed 2016·Granted Jul 10, 2018·0 cites·13 claims
- 0753US7039544B2Method for testing circuit units to be tested and test apparatusINFINEON TECHNOLOGIES AG·Filed 2004·Granted May 2, 2006·6 cites·12 claims
- 0850US9435849B2Method for testing semiconductor dies and a test apparatusINFINEON TECHNOLOGIES AG·Filed 2014·Granted Sep 6, 2016·0 cites·4 claims
- 0950US7228477B2Apparatus and method for testing circuit units to be testedINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 5, 2007·5 cites·15 claims
- 1049US7353425B2Data processing circuit apparatus having a data transmission unit of redundant designINFINEON TECHNOLOGIES AG·Filed 2004·Granted Apr 1, 2008·1 cites·9 claims
- 1149US7254758B2Method and apparatus for testing circuit units to be tested with different test mode data setsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Aug 7, 2007·2 cites·19 claims
- 1245US7340313B2Monitoring device for monitoring internal signals during initialization of an electronic circuitINFINEON TECHNOLOGIES AG·Filed 2005·Granted Mar 4, 2008·1 cites·6 claims
- 1345US2005108461A1Memory apparatus having redundancy, and method for storing dataINFINEON TECHNOLOGIES AG·Filed 2004·Application pending·0 cites
- 1439US2005283258A1Method for controlling command sequences, and command control device for carrying out the methodTHALMANN ERWIN·Filed 2005·Application pending·0 cites
- 1536US7188291B2Circuit and method for testing a circuit having memory array and addressing and control unitINFINEON TECHNOLOGIES AG·Filed 2004·Granted Mar 6, 2007·0 cites·15 claims
- 1636US7143325B2Method for testing circuit units to be tested by means of majority decisions and test device for performing the methodINFINEON TECHNOLOGIES AG·Filed 2004·Granted Nov 28, 2006·0 cites·16 claims
- 1735US2005076277A1Test apparatus with static storage device and test methodFiled 2004·Application pending·0 cites
- 1834US7191085B2Method for testing an electric circuitINFINEON TECHNOLOGIES AG·Filed 2005·Granted Mar 13, 2007·0 cites·20 claims
- 1933US7343532B2Testing memory units in a digital circuitINFINEON TECHNOLOGIES AG·Filed 2003·Granted Mar 11, 2008·0 cites·6 claims
- 2033US2005270865A1Test apparatus with memory data converter for redundant bit and word linesINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 2132US7308622B2Integrated memory and method for testing the memoryINFINEON TECHNOLOGIES AG·Filed 2003·Granted Dec 11, 2007·0 cites·18 claims
- 2232US2006010359A1Method for testing electronic circuit units and test apparatusINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 2332US2005058007A1Method for testing a circuit unit to be tested, and a test apparatusFiled 2004·Application pending·0 cites
- 2432US2006242518A1Method for verification of electronic circuit units, and an apparatus for carrying out the methodINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 2531US2004268081A1Apparatus and method for storing digital dataTHALMANN ERWIN·Filed 2004·Application pending·0 cites
- 2629US7292479B2Memory device with multistage sense amplifierINFINEON TECHNOLGOIES AG·Filed 2005·Granted Nov 6, 2007·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →