Inventor · disambiguated record
Eric M. Walstra
Also filed as: WALSTRA ERIC M
2 granted patents·63 citations·filing 2008–2011
65Inventor score
Technology areasG01B
Top patents by PatentIndex Score
2 records- 0191US7796278B2Method for precisely measuring position of a part to be inspected at a part inspection stationGII ACQUISITION LLC·Filed 2008·Granted Sep 14, 2010·40 cites·22 claims
- 0284US8390826B2Method and system for optically inspecting partsWALSTRA ERIC M·Filed 2011·Granted Mar 5, 2013·23 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →