Inventor · disambiguated record
Ethan H. Cannon
Also filed as: CANNON ETHAN · CANNON ETHAN H · CANNON ETHAN HARRISON
42 granted patents·7 pending applications·190 citations·filing 2003–2023
97Inventor score
Top patents by PatentIndex Score
49 records- 0193US7521776B2Soft error reduction of CMOS circuits on substrates with hybrid crystal orientation using buried recombination centersIBM·Filed 2006·Granted Apr 21, 2009·24 cites·1 claims
- 0289US8138573B2On-chip heater and methods for fabrication thereof and use thereofCANNON ETHAN H·Filed 2010·Granted Mar 20, 2012·10 cites·16 claims
- 0385US9013219B2Filtered radiation hardened flip flop with reduced power consumptionBOEING CO·Filed 2013·Granted Apr 21, 2015·7 cites·15 claims
- 0485US7965540B2Structure and method for improving storage latch susceptibility to single event upsetsIBM·Filed 2008·Granted Jun 21, 2011·10 cites·3 claims
- 0585US7888959B2Apparatus and method for hardening latches in SOI CMOS devicesIBM·Filed 2007·Granted Feb 15, 2011·11 cites·4 claims
- 0685US7875854B2Design structure for alpha particle sensor in SOI technology and structure thereofIBM·Filed 2008·Granted Jan 25, 2011·8 cites·16 claims
- 0783US8300452B2Structure and method for improving storage latch susceptibility to single event upsetsCANNON ETHAN H·Filed 2011·Granted Oct 30, 2012·6 cites·8 claims
- 0883US7704847B2On-chip heater and methods for fabrication thereof and use thereofIBM·Filed 2006·Granted Apr 27, 2010·9 cites·9 claims
- 0983US7315075B2Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errorsIBM·Filed 2005·Granted Jan 1, 2008·8 cites·12 claims
- 1079US7375339B2Monitoring ionizing radiation in silicon-on insulator integrated circuitsIBM·Filed 2006·Granted May 20, 2008·8 cites·5 claims
- 1176US8120131B2Array of alpha particle sensorsCANNON ETHAN H·Filed 2009·Granted Feb 21, 2012·6 cites·5 claims
- 1276US7795679B2Device structures with a self-aligned damage layer and methods for forming such device structuresIBM·Filed 2008·Granted Sep 14, 2010·5 cites·19 claims
- 1375US7935609B2Method for fabricating semiconductor device having radiation hardened insulatorsIBM·Filed 2008·Granted May 3, 2011·4 cites·20 claims
- 1474US8207753B2Method and apparatus for reducing radiation and cross-talk induced data errorsCABANAS-HOLMEN MANUEL F·Filed 2011·Granted Jun 26, 2012·6 cites·14 claims
- 1573US7388274B2Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errorsIBM·Filed 2007·Granted Jun 17, 2008·4 cites·13 claims
- 1672US7473904B2Device for monitoring ionizing radiation in silicon-on insulator integrated circuitsIBM·Filed 2008·Granted Jan 6, 2009·5 cites·15 claims
- 1771US7397692B1High performance single event upset hardened SRAM cellIBM·Filed 2006·Granted Jul 8, 2008·7 cites·8 claims
- 1870US7943482B2Method for semiconductor device having radiation hardened insulators and design structure thereofIBM·Filed 2008·Granted May 17, 2011·4 cites·10 claims
- 1969US8647909B2Array of alpha particle sensorsCANNON ETHAN H·Filed 2012·Granted Feb 11, 2014·2 cites·5 claims
- 2069US7989865B2Deep trench capacitor for SOI CMOS devices for soft error immunityIBM·Filed 2008·Granted Aug 2, 2011·3 cites·16 claims
- 2168US7550730B1Method for detecting alpha particles in SOI technologyIBM·Filed 2008·Granted Jun 23, 2009·5 cites·4 claims
- 2266US7651902B2Hybrid substrates and methods for forming such hybrid substratesIBM·Filed 2007·Granted Jan 26, 2010·2 cites·7 claims
- 2365US11029355B2Direct measurement test structures for measuring static random access memory static noise marginBOEING CO·Filed 2019·Granted Jun 8, 2021·2 cites·22 claims
- 2465US8754701B2Interleaved transient filterBOEING CO·Filed 2012·Granted Jun 17, 2014·2 cites·19 claims
- 2565US7881135B2Method for QCRIT measurement in bulk CMOS using a switched capacitor circuitIBM·Filed 2007·Granted Feb 1, 2011·4 cites·20 claims
- 2664US8847621B2Single event transient and upset mitigation for silicon-on-insulator CMOS technologyCANNON ETHAN·Filed 2012·Granted Sep 30, 2014·4 cites·17 claims
- 2763US7719887B2CMOS storage devices configurable in high performance mode or radiation tolerant modeIBM·Filed 2007·Granted May 18, 2010·6 cites·25 claims
- 2862US7791123B2Soft error protection structure employing a deep trenchIBM·Filed 2008·Granted Sep 7, 2010·2 cites·12 claims
- 2962US7064414B2Heater for annealing trapped charge in a semiconductor deviceIBM·Filed 2004·Granted Jun 20, 2006·10 cites·29 claims
- 3061US9223037B2Structure and method to ensure correct operation of an integrated circuit in the presence of ionizing radiationCANNON ETHAN H·Filed 2012·Granted Dec 29, 2015·1 cites·20 claims
- 3159US9165917B2In-line stacking of transistors for soft error rate hardeningCANNON ETHAN H·Filed 2009·Granted Oct 20, 2015·2 cites·11 claims
- 3255US11601119B2Radiation hardened flip-flop circuit for mitigating single event transientsBOEING CO·Filed 2021·Granted Mar 7, 2023·0 cites·20 claims
- 3352US8054099B2Method and apparatus for reducing radiation and cross-talk induced data errorsBOEING CO·Filed 2009·Granted Nov 8, 2011·2 cites·7 claims
- 3452US7791169B2Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errorsIBM·Filed 2008·Granted Sep 7, 2010·0 cites·15 claims
- 3552US2008203492A1Methods for fabricating semiconductor device structures with reduced susceptibility to latch-up and semiconductor device structures formed by the methodsIBM·Filed 2008·Application pending·0 cites
- 3652US2008242016A1Methods for fabricating semiconductor device structures with reduced susceptibility to latch-up and semiconductor device structures formed by the methodsIBM·Filed 2008·Application pending·0 cites
- 3750US12461813B2Radiation induced error detection in solid-state devicesBOEING CO·Filed 2023·Granted Nov 4, 2025·0 cites·20 claims
- 3850US2009113357A1Monitoring ionizing radiation in silicon-on insulator integrated circuitsABADEER WAGDI WILLIAM·Filed 2007·Application pending·0 cites
- 3949US8133772B2Deep trench capacitor for SOI CMOS devices for soft error immunityBARTH JR JOHN E·Filed 2011·Granted Mar 13, 2012·0 cites·7 claims
- 4049US2007194403A1Methods for fabricating semiconductor device structures with reduced susceptibility to latch-up and semiconductor device structures formed by the methodsIBM·Filed 2006·Application pending·0 cites
- 4149US2008116529A1Shallow trench isolation structure for shielding trapped charge in a semiconductor deviceCANNON ETHAN H·Filed 2008·Application pending·0 cites
- 4248US7385275B2Shallow trench isolation method for shielding trapped charge in a semiconductor deviceIBM·Filed 2006·Granted Jun 10, 2008·0 cites·13 claims
- 4347US8035200B2Neutralization of trapped charge in a charge accumulation layer of a semiconductor structureIBM·Filed 2010·Granted Oct 11, 2011·0 cites·16 claims
- 4447US7736915B2Method for neutralizing trapped charge in a charge accumulation layer of a semiconductor structureIBM·Filed 2006·Granted Jun 15, 2010·0 cites·8 claims
- 4546US8354858B2Apparatus and method for hardening latches in SOI CMOS devicesIBM·Filed 2011·Granted Jan 15, 2013·0 cites·9 claims
- 4646US7750406B2Design structure incorporating a hybrid substrateIBM·Filed 2007·Granted Jul 6, 2010·0 cites·13 claims
- 4744US7183758B2Automatic exchange of degraders in accelerated testing of computer chipsIBM·Filed 2003·Granted Feb 27, 2007·1 cites·19 claims
- 4843US2007158779A1Methods and semiconductor structures for latch-up suppression using a buried damage layerIBM·Filed 2006·Application pending·0 cites
- 4942US2009001481A1Digital circuits having additional capacitors for additional stabilityCANNON ETHAN HARRISON·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →