Inventor · disambiguated record
Eun Hee Jeang
Also filed as: JEANG EUN HEE
4 granted patents·1 citations·filing 2016–2023
57Inventor score
Top patents by PatentIndex Score
4 records- 0175US10816480B2Method of detecting a defect on a substrate, apparatus for performing the same and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Oct 27, 2020·1 cites·19 claims
- 0270US11862457B2Wafer cleaning apparatus, method for cleaning wafer and method for fabricating semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jan 2, 2024·0 cites·15 claims
- 0362US11581182B2Wafer cleaning apparatus, method for cleaning wafer and method for fabricating semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 14, 2023·0 cites·18 claims
- 0434US11033244B2In vivo radiation amount measuring instrument using film dosimeter that undergoes shape change with expansionNAT CANCER CT·Filed 2016·Granted Jun 15, 2021·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →