Inventor · disambiguated record
Eunhye Oh
Also filed as: OH EUNHYE
7 granted patents·2 pending applications·0 citations·filing 2020–2024
68Inventor score
Files withSAMSUNG ELECTRONICS CO LTD9
Top patents by PatentIndex Score
9 records- 0170US2025068517A1Storage device including mapping memory and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0268US12334170B2Operating and testing semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jun 17, 2025·0 cites·20 claims
- 0365US12164376B2Storage device including mapping memory and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Dec 10, 2024·0 cites·18 claims
- 0462US12499961B2Built-in-self-test logic, memory device with same, and memory module testing methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Dec 16, 2025·0 cites·20 claims
- 0558US11804276B2Built-in-self-test logic, memory device with same, and memory module testing methodSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Oct 31, 2023·0 cites·20 claims
- 0651US11867757B2Built-in self-test circuits and semiconductor integrated circuits including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jan 9, 2024·0 cites·18 claims
- 0747US11698852B2Apparatus and method for writing data in a memorySAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jul 11, 2023·0 cites·16 claims
- 0847US2025191671A1Built-in-self-test logic, memory device including built-in-self-test logic, and test method for memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0939US11698410B2Semiconductor integrated circuit and method of testing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jul 11, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →