Inventor · disambiguated record
Evgeny Bal
Also filed as: BAL EVGENY
5 granted patents·1 pending application·4 citations·filing 2018–2024
67Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD6
Top patents by PatentIndex Score
6 records- 0180US11348224B2Mask inspection of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted May 31, 2022·2 cites·20 claims
- 0276US11276160B2Determining a critical dimension variation of a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Mar 15, 2022·2 cites·17 claims
- 0369US11756188B2Determining a critical dimension variation of a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Sep 12, 2023·0 cites·14 claims
- 0464US11983867B2Mask inspection of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted May 14, 2024·0 cites·20 claims
- 0554US12400314B2Mask inspection for semiconductor specimen fabricationAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Aug 26, 2025·0 cites·20 claims
- 0652US2025232431A1Coreset based mask inspection for semiconductor specimen fabricationAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →