Inventor · disambiguated record
Ewald Niehuis
Also filed as: NIEHUIS EWALD
4 granted patents·2 pending applications·55 citations·filing 1995–2016
75Inventor score
Top patents by PatentIndex Score
6 records- 0173US10354851B2Secondary ion mass spectrometer and secondary ion mass spectrometric methodIONTOF TECH GMBH·Filed 2016·Granted Jul 16, 2019·5 cites·24 claims
- 0265US6107629AMethod to determine depth profiles in an area of thin coatingFiled 1997·Granted Aug 22, 2000·34 cites·3 claims
- 0355US8785844B2Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samplesNIEHUIS EWALD·Filed 2011·Granted Jul 22, 2014·1 cites·29 claims
- 0452US5633495AProcess for operating a time-of-flight secondary-ion mass spectrometerION TOF GMBH·Filed 1995·Granted May 27, 1997·15 cites·3 claims
- 0551US2014346340A1Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samplesION TOF TECHNOLOGIES GMBH·Filed 2014·Application pending·0 cites
- 0631US2009152457A1Method for Analysis of a Solid SampleION TOF GMBH·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →