Inventor · disambiguated record
Eyal En Gad
Also filed as: EN GAD EYAL
17 granted patents·11 pending applications·20 citations·filing 2013–2025
88Inventor score
Top patents by PatentIndex Score
28 records- 0197US11394403B1Error correction based on rate adaptive low density parity check (LDPC) codes with flexible column weights in the parity check matricesMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 19, 2022·7 cites·18 claims
- 0283US9086955B2Rank-modulation rewriting codes for flash memoriesCALIFORNIA INST OF TECHN·Filed 2013·Granted Jul 21, 2015·8 cites·33 claims
- 0382US12218681B2Bit mask for syndrome decoding operationsMICRON TECHNOLOGY INC·Filed 2022·Granted Feb 4, 2025·1 cites·27 claims
- 0476US12328129B2Bypassing iterations in a bit flipping decoder using a least reliable bit energy functionMICRON TECHNOLOGY INC·Filed 2023·Granted Jun 10, 2025·0 cites·20 claims
- 0576US2025272004A1Bit flipping decoder with optimized maximum iterations for varied bit flipping thresholdsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0676US2025266848A1Bypassing iterations in a bit flipping decoder using a least reliable bit energy functionMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0776US2025278333A1Efficient memory use to support soft information in bit flipping decodersMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0874US12332743B2Efficient memory use to support soft information in bit flipping decodersMICRON TECHNOLOGY INC·Filed 2023·Granted Jun 17, 2025·0 cites·20 claims
- 0974US12321613B2Bit flipping decoder with optimized maximum iterations for varied bit flipping thresholdsMICRON TECHNOLOGY INC·Filed 2023·Granted Jun 3, 2025·0 cites·20 claims
- 1073US2024338146A1Separation of Parity Columns in Bit-Flip Decoding of Low-Density Parity-Check Codes with Pipelining and Column ParallelismMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1170US2025086056A1Syndrome decoding systemMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1269US12014071B2Separation of parity columns in bit-flip decoding of low-density parity-check codes with pipelining and column parallelismMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 18, 2024·0 cites·20 claims
- 1369US2025028373A1Voltage scaling based on error rateMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1469US2025028595A1Voltage scaling based on error rateMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1568US12437788B2Syndrome decoding systemMICRON TECHNOLOGY INC·Filed 2023·Granted Oct 7, 2025·0 cites·24 claims
- 1667US2025377703A1Power management based on preliminary syndrome calculationMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1767US2025379597A1Preliminary syndrome calculationMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1864US9983808B2NAND flash reliability with rank modulationCALIFORNIA INST OF TECHN·Filed 2015·Granted May 29, 2018·2 cites·25 claims
- 1962US12164375B2Syndrome decoding systemMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 10, 2024·0 cites·23 claims
- 2060US11777522B1Bit flipping decoder with dynamic bit flipping criteriaMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 3, 2023·0 cites·20 claims
- 2155US9230652B2Flash memories using minimum push up, multi-cell and multi-permutation schemes for data storageCALIFORNIA INST OF TECHN·Filed 2013·Granted Jan 5, 2016·1 cites·18 claims
- 2252US9946475B2Joint rewriting and error correction in write-once memoriesCALIFORNIA INST OF TECHN·Filed 2013·Granted Apr 17, 2018·1 cites·25 claims
- 2352US2025150094A1Data encoding and decoding schemesMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2452US2025156271A1Syndrome calculationMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2545US10191803B2Rewriting flash memories by message passingCALIFORNIA INST OF TECHN·Filed 2016·Granted Jan 29, 2019·0 cites·20 claims
- 2644US9666280B2Flash memories using minimum push up, multi-cell and multi-permutation schemes for data storageCALIFORNIA INST OF TECHN·Filed 2015·Granted May 30, 2017·0 cites·20 claims
- 2739US9916197B2Rank-modulation rewriting codes for flash memoriesCALIFORNIA INST OF TECHN·Filed 2015·Granted Mar 13, 2018·0 cites·20 claims
- 2830US10379945B2Asymmetric error correction and flash-memory rewriting using polar codesCALIFORNIA INST OF TECHN·Filed 2015·Granted Aug 13, 2019·0 cites·27 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →