Inventor · disambiguated record
Eyal Segev
Also filed as: SEGEV EYAL
4 granted patents·1 pending application·2 citations·filing 2004–2021
58Inventor score
Top patents by PatentIndex Score
5 records- 0160US2023280282A1Continuous bump measurement height metrologyCAMTEK LTD·Filed 2021·Application pending·0 cites
- 0252US12474162B2Bump measurement height metrologyCAMTEK LTD·Filed 2021·Granted Nov 18, 2025·0 cites·21 claims
- 0338US8111945B2System and method for providing a blended pictureKEHAT ROY·Filed 2008·Granted Feb 7, 2012·1 cites·20 claims
- 0435US10734340B2Height measurements of conductive structural elements that are surrounded by a photoresist layerCAMTEK LTD·Filed 2019·Granted Aug 4, 2020·0 cites·20 claims
- 0528US8754668B2Integrated circuit and a method for testing a multi-tap integrated circuitAMON YOSSI·Filed 2004·Granted Jun 17, 2014·1 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when Eyal Segev files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →