Inventor · disambiguated record
Fanghong Gn
Also filed as: GN FANGHONG
1 granted patent·1 pending application·2 citations·filing 2013–2015
20Inventor score
Technology areasH10P
Top patents by PatentIndex Score
2 records- 0163US9029855B2Layout for reticle and wafer scanning electron microscope registration or overlay measurementsNING GUO XIANG·Filed 2013·Granted May 12, 2015·2 cites·12 claims
- 0240US2015221565A1Layout for reticle and wafer scanning electron microscope registration or overlay measurementsGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →