Inventor · disambiguated record
Farideh Golshan
Also filed as: GOLSHAN FARIDEH
9 granted patents·72 citations·filing 1997–2013
87Inventor score
Top patents by PatentIndex Score
9 records- 0168US6675338B1Internally generated vectors for burnin systemSUN MICROSYSTEMS INC·Filed 2000·Granted Jan 6, 2004·15 cites·5 claims
- 0267US6751764B1Method and apparatus for testing and debugging a circuitSUN MICROSYSTEMS INC·Filed 2001·Granted Jun 15, 2004·14 cites·5 claims
- 0366US6671841B1Method for on-line circuit debug using JTAG and shadow scan in a microprocessorSUN MICROSYSTEMS INC·Filed 2000·Granted Dec 30, 2003·14 cites·24 claims
- 0453US6662325B1Apparatus for on-line circuit debug using JTAG and shadow scan in a microprocessorSUN MICROSYSTEMS INC·Filed 2000·Granted Dec 9, 2003·9 cites·22 claims
- 0544US9885753B2Scan systems and methodsNVIDIA CORP·Filed 2013·Granted Feb 6, 2018·0 cites·18 claims
- 0639US6581018B1Multiplexer select line exclusivity check method and apparatusSUN MICROSYSTEMS INC·Filed 2000·Granted Jun 17, 2003·1 cites·3 claims
- 0739US5872796AMethod for interfacing boundary-scan circuitry with linearized impedance control type output driversSUN MICROSYSTEMS INC·Filed 1997·Granted Feb 16, 1999·8 cites·25 claims
- 0836US6219812B1Apparatus and method for interfacing boundary-scan circuitry with DTL output driversSUN MICROSYSTEMS INC·Filed 1998·Granted Apr 17, 2001·7 cites·20 claims
- 0932US5892778ABoundary-scan circuit for use with linearized impedance control type output driversSUN MICROSYSTEMS INC·Filed 1997·Granted Apr 6, 1999·4 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →