Inventor · disambiguated record
Fang-Wei Lin
Also filed as: LIN FANG · LIN FANG-WEI
4 granted patents·6 citations·filing 2013–2019
63Inventor score
Top patents by PatentIndex Score
4 records- 0179US9558955B2Formation method of semiconductor device that includes performing hydrogen-containing plasma treatment on metal gate stackTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 31, 2017·3 cites·20 claims
- 0274US10438957B2Memory structure and manufacturing method thereofWINBOND ELECTRONICS CORP·Filed 2017·Granted Oct 8, 2019·3 cites·9 claims
- 0348US10529726B2Method of manufacturing memory structureWINBOND ELECTRONICS CORP·Filed 2019·Granted Jan 7, 2020·0 cites·7 claims
- 0443US9847302B2Wafer surface conditioning for stability in fab environmentTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Dec 19, 2017·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →