Inventor · disambiguated record
Farhad Taghibakhsh
Also filed as: TAGHIBAKHSH FARHAD
6 granted patents·4 pending applications·32 citations·filing 2005–2018
79Inventor score
Files withPERKINELMER HOLDINGS INC3QUALCOMM INC3DAGHIGHIAN HENRY M1KARIM KARIM SALLAUDIN1TAGHIBAKHSH FARHAD1
Top patents by PatentIndex Score
10 records- 0186US7995113B2High gain digital imaging systemUNIV FRASER SIMON·Filed 2005·Granted Aug 9, 2011·13 cites·48 claims
- 0282US9515106B2Radiation imaging device with metal-insulator-semiconductor photodetector and thin film transistorPERKINELMER HOLDINGS INC·Filed 2014·Granted Dec 6, 2016·6 cites·6 claims
- 0378US8993971B2High resolution positron emission tomographyTAGHIBAKHSH FARHAD·Filed 2012·Granted Mar 31, 2015·7 cites·12 claims
- 0473US10775500B2Ultrasonic transducer pixel readout circuitry and methods for ultrasonic phase imagingQUALCOMM INC·Filed 2017·Granted Sep 15, 2020·2 cites·20 claims
- 0568US8199236B2Device and pixel architecture for high resolution digitalKARIM KARIM SALLAUDIN·Filed 2008·Granted Jun 12, 2012·3 cites·21 claims
- 0658US8729486B2MODFET active pixel X-ray detectorDAGHIGHIAN HENRY M·Filed 2011·Granted May 20, 2014·1 cites·19 claims
- 0756US2014263952A1High performance digital imaging systemPERKINELMER HOLDINGS INC·Filed 2013·Application pending·0 cites
- 0843US2019354743A1Apparatus and Method for Biometric SamplingQUALCOMM INC·Filed 2018·Application pending·0 cites
- 0937US2014266262A1High resolution fingerprint imaging devicePERKINELMER HOLDINGS INC·Filed 2013·Application pending·0 cites
- 1035US2018080839A1Piezoelectric material test probe and methodQUALCOMM INC·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →