Inventor · disambiguated record
Fateh A. Tipu
Also filed as: TIPU FATEH · TIPU FATEH A · TIPU FATEH ALI
12 granted patents·370 citations·filing 1997–2019
89Inventor score
Top patents by PatentIndex Score
12 records- 0194US7561158B2Method and apparatus for presenting feature importance in predictive modelingIBM·Filed 2006·Granted Jul 14, 2009·45 cites·15 claims
- 0288US11410891B2Anomaly detection and remedial recommendationIBM·Filed 2019·Granted Aug 9, 2022·5 cites·15 claims
- 0383US7539585B2System and method for rule-based data mining and problem detection for semiconductor fabricationIBM·Filed 2007·Granted May 26, 2009·7 cites·11 claims
- 0479US5970464AData mining based underwriting profitability analysisIBM·Filed 1997·Granted Oct 19, 1999·302 cites·7 claims
- 0573US7650251B2System and method for rule-based data mining and problem detection for semiconductor fabricationIBM·Filed 2008·Granted Jan 19, 2010·6 cites·11 claims
- 0666US8594821B2Detecting combined tool incompatibilities and defects in semiconductor manufacturingBASEMAN ROBERT J·Filed 2011·Granted Nov 26, 2013·2 cites·21 claims
- 0762US9915942B2System and method for identifying significant and consumable-insensitive trace featuresIBM·Filed 2015·Granted Mar 13, 2018·1 cites·18 claims
- 0862US8315729B2Enhancing investigation of variability by inclusion of similar objects with known differences to the original onesBASEMAN ROBERT J·Filed 2010·Granted Nov 20, 2012·1 cites·19 claims
- 0958US8533635B2Rule-based root cause and alias analysis for semiconductor manufacturingBASEMAN ROBERT J·Filed 2010·Granted Sep 10, 2013·1 cites·19 claims
- 1051US11954615B2Model management for non-stationary systemsIBM·Filed 2019·Granted Apr 9, 2024·0 cites·20 claims
- 1150US8639375B2Enhancing investigation of variability by inclusion of similar objects with known differences to the original onesIBM·Filed 2012·Granted Jan 28, 2014·0 cites·19 claims
- 1249US12197133B2Tool control using multistage LSTM for predicting on-wafer measurementsIBM·Filed 2019·Granted Jan 14, 2025·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →