Inventor · disambiguated record
Faa-Ching M. Wang
Also filed as: WANG FAA-CHING · WANG FAA-CHING M
4 granted patents·35 citations·filing 1984–1992
75Inventor score
Top patents by PatentIndex Score
4 records- 0149US4581576ANondestructive method for profiling imperfection levels in high resistivity semiconductor wafersHEWLETT PACKARD CO·Filed 1984·Granted Apr 8, 1986·12 cites·6 claims
- 0248US5186784AProcess for improved doping of semiconductor crystalsTEXAS INSTRUMENTS INC·Filed 1989·Granted Feb 16, 1993·11 cites·16 claims
- 0334US5259916AProcess for improved doping of semiconductor crystalsTEXAS INSTRUMENTS INC·Filed 1992·Granted Nov 9, 1993·5 cites·6 claims
- 0432US4525239AExtrinsic gettering of GaAs wafers for MESFETS and integrated circuitsHEWLETT PACKARD CO·Filed 1984·Granted Jun 25, 1985·7 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →