Inventor · disambiguated record
Farn Wang
Also filed as: WANG FARN
2 granted patents·4 pending applications·97 citations·filing 2001–2022
58Inventor score
Top patents by PatentIndex Score
6 records- 0186US6665845B1System and method for topology based noise estimation of submicron integrated circuit designsSUN MICROSYSTEMS INC·Filed 2001·Granted Dec 16, 2003·97 cites·6 claims
- 0244US2014001741A1Document binderWANG FARN·Filed 2013·Application pending·0 cites
- 0342US11846972B2Method and apparatus for generating software test reportsUNIV NAT TAIWAN·Filed 2022·Granted Dec 19, 2023·0 cites·11 claims
- 0441US2010131920A1Parametric eda function tool and method of simplifying eda programming languageUNIV NAT TAIWAN·Filed 2009·Application pending·0 cites
- 0533US2008148236A1Test device, method, and computer readable medium for deriving a qualified test case plan from a test case databaseINST INFORMATION INDUSTRY·Filed 2007·Application pending·0 cites
- 0631US2006101331A1Methods and systems for automated test-case generationINST INFORMATION INDUSTRY·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →