Inventor · disambiguated record
Ferenc Benedek
Also filed as: BENEDEK FERENC
8 granted patents·4 pending applications·33 citations·filing 2016–2023
84Inventor score
Technology areasA61B
Files withZETO INC12
Top patents by PatentIndex Score
12 records- 0196US11160505B2System and method for testing contact quality of electrical-biosignal electrodesZETO INC·Filed 2020·Granted Nov 2, 2021·15 cites·19 claims
- 0293US11166673B2Electroencephalography headset and system for collecting biosignal dataZETO INC·Filed 2020·Granted Nov 9, 2021·3 cites·6 claims
- 0388US11432770B2System and method for testing contact quality of electrical-biosignal electrodesZETO INC·Filed 2020·Granted Sep 6, 2022·2 cites·20 claims
- 0485US10799180B2System and method for testing contact quality of electrical-biosignal electrodesZETO INC·Filed 2016·Granted Oct 13, 2020·7 cites·20 claims
- 0584US10660572B2System and method for testing contact quality of electrical-biosignal electrodesZETO INC·Filed 2017·Granted May 26, 2020·4 cites·7 claims
- 0679US11160502B2Electroencephalography headset and system for collecting biosignal dataZETO INC·Filed 2017·Granted Nov 2, 2021·2 cites·19 claims
- 0779US2023346313A1System and method for testing contact quality of electrical-biosignal electrodesZETO INC·Filed 2023·Application pending·0 cites
- 0876US2023000434A1Electroencephalography headset and system for collecting biosignal dataZETO INC·Filed 2022·Application pending·0 cites
- 0974US11471104B2Electroencephalography headset and system for collecting biosignal dataZETO INC·Filed 2021·Granted Oct 18, 2022·0 cites·20 claims
- 1074US11457867B2Electroencephalography headset and system for collecting biosignal dataZETO INC·Filed 2021·Granted Oct 4, 2022·0 cites·19 claims
- 1174US2023037428A1System and method for testing contact quality of electrical-biosignal electrodesZETO INC·Filed 2022·Application pending·0 cites
- 1257US2020397375A1System and method for testing contact quality of electrical-biosignal electrodesZETO INC·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →