Inventor · disambiguated record
Feng-Ju Chang
Also filed as: CHANG FENG-JU
12 granted patents·3 pending applications·161 citations·filing 1995–2024
90Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD7AMAZON TECH INC3TAIWAN SEMICONDUCTOR MFG2CHIEN TI ENTERPRISE CO LTD1NEC LAB AMERICA INC1
Top patents by PatentIndex Score
15 records- 0198US9390217B2Methodology of optical proximity correction optimizationTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 12, 2016·68 cites·20 claims
- 0297US8631360B2Methodology of optical proximity correction optimizationWANG HUNG-CHUN·Filed 2012·Granted Jan 14, 2014·34 cites·19 claims
- 0394US12002451B1Automatic speech recognitionAMAZON TECH INC·Filed 2021·Granted Jun 4, 2024·14 cites·20 claims
- 0494US11915690B1Automatic speech recognitionAMAZON TECH INC·Filed 2021·Granted Feb 27, 2024·16 cites·20 claims
- 0588US9262578B2Method for integrated circuit manufacturingTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 16, 2016·9 cites·20 claims
- 0686US11048161B2Optical proximity correction methodology using pattern classification for target placementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 29, 2021·2 cites·20 claims
- 0779US10360339B2Method for integrated circuit manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jul 23, 2019·2 cites·20 claims
- 0870US9026955B1Methodology for pattern correctionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 5, 2015·2 cites·17 claims
- 0967US10991145B2Pose-variant 3D facial attribute generationNEC LAB AMERICA INC·Filed 2019·Granted Apr 27, 2021·1 cites·18 claims
- 1067US2024321264A1Automatic speech recognitionAMAZON TECH INC·Filed 2024·Application pending·0 cites
- 1162US10747938B2Method for integrated circuit manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 18, 2020·0 cites·20 claims
- 1259US10527928B2Optical proximity correction methodology using pattern classification for target placementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jan 7, 2020·0 cites·20 claims
- 1351US2023411224A1System and method for detecting defects on a wafer and related non-transitory computer-readable mediumTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Application pending·0 cites
- 1441US2014119638A1System, method and computer program product to evaluate a semiconductor wafer fabrication processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Application pending·0 cites
- 1540US5489232AModel motorcycleCHIEN TI ENTERPRISE CO LTD·Filed 1995·Granted Feb 6, 1996·13 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →