Inventor · disambiguated record

Feijue Liu

Also filed as: LIU FEIJUE

1 granted patent·2 citations·filing 2013–2013

18Inventor score

Technology areasH10P

Files withSHANGHAI HUALI MICROELECT CORP1

Top patents by PatentIndex Score

1 record

0162US9269639B2Method of detecting and measuring contact alignment shift relative to gate structures in a semicondcutor deviceSHANGHAI HUALI MICROELECT CORP·Filed 2013·Granted Feb 23, 2016·2 cites·11 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →