Inventor · disambiguated record

Feng-Jia Shiu

Also filed as: SHIU FENG-JIA

51 granted patents·11 pending applications·247 citations·filing 2003–2025

98Inventor score

Technology areasH10P H10F H10W G03F H10B

Files withTAIWAN SEMICONDUCTOR MFG CO LTD43 TAIWAN SEMICONDUCTOR MFG11 LAN SHUN-WEI2 CHOU HSING-FEI1 HSU ALEX1

Top patents by PatentIndex Score

62 records

0199US9304403B2System and method for lithography alignmentTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Apr 5, 2016·64 cites·20 claims
0295US10121811B1Method of high-aspect ratio pattern formation with submicron pixel pitchTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Nov 6, 2018·12 cites·20 claims
0394US7648851B2Method of fabricating backside illuminated image sensorTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Jan 19, 2010·46 cites·19 claims
0493US12165867B2Method for reducing charging of semiconductor wafersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 10, 2024·1 cites·20 claims
0592US11769662B2Method for reducing charging of semiconductor wafersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 26, 2023·2 cites·20 claims
0691US10439135B2VIA structure and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Oct 8, 2019·5 cites·20 claims
0790US10090357B2Method of using a surfactant-containing shrinkage material to prevent photoresist pattern collapse caused by capillary forcesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Oct 2, 2018·5 cites·20 claims
0889US10797091B2Semiconductor imaging device having improved dark current performanceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Oct 6, 2020·2 cites·20 claims
0989US10546889B2Method of high-aspect ratio pattern formation with submicron pixel pitchTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jan 28, 2020·5 cites·20 claims
1088US11049767B2Semiconductor device and methods of manufacturing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 29, 2021·4 cites·20 claims
1188US8809179B2Method for reducing topography of non-volatile memory and resulting memory cellsWANG SHIH WEI·Filed 2007·Granted Aug 19, 2014·15 cites·20 claims
1286US11658031B2Implantation mask formationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted May 23, 2023·1 cites·20 claims
1386US10734436B2Method of using a surfactant-containing shrinkage material to prevent photoresist pattern collapse caused by capillary forcesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Aug 4, 2020·3 cites·20 claims
1486US10510587B2Method for manufacturing semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 17, 2019·3 cites·20 claims
1584US8440495B2Method for reducing crosstalk in image sensors using implant technologyLIU JEN-CHENG·Filed 2007·Granted May 14, 2013·8 cites·20 claims
1683US10186542B1Patterning for substrate fabricationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jan 22, 2019·3 cites·20 claims
1782US12439837B2Via structure and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Oct 7, 2025·0 cites·20 claims
1881US7923344B2Method of fabricating backside illuminated image sensorTAIWAN SEMICONDUCTOR MFG·Filed 2009·Granted Apr 12, 2011·4 cites·20 claims
1981US7189957B2Methods to improve photonic performances of photo-sensitive integrated circuitsTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Mar 13, 2007·6 cites·18 claims
2080US12293940B2Techniques for forming a deep trench isolation structure between photodiodes by forming a first set of trenches based on a first pattern and forming a second set of trenches based on a second patternTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted May 6, 2025·0 cites·20 claims
2180US12100592B2Implantation mask formationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 24, 2024·0 cites·20 claims
2280US8409456B2Planarization method for high wafer topographyLAN SHUN-WEI·Filed 2011·Granted Apr 2, 2013·8 cites·24 claims
2380US2025069881A1Method for reducing charging of semiconductor wafersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
2479US9153620B2Method of fabricating a metal grid for semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Oct 6, 2015·2 cites·20 claims
2578US12040336B2Semiconductor imaging device having improved dark current performanceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 16, 2024·0 cites·20 claims
2678US8357561B2Method of fabricating backside illuminated image sensorTAIWAN SEMICONDUCTOR MFG·Filed 2011·Granted Jan 22, 2013·1 cites·20 claims
2778US2024379357A1Implantation mask formationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
2878US2024313010A1Semiconductor imaging device having improved dark current performanceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
2978US2024404877A1Methods of manufacturing semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
3077US8110881B2MRAM cell structure with a blocking layer for avoiding short circuitsKAO YA-CHEN·Filed 2007·Granted Feb 7, 2012·7 cites·19 claims
3177US2025233013A1Double patterning techniques for forming a deep trench isolation structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
3276US12010933B2Via structure and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
3376US7443005B2Lens structures suitable for use in image sensors and method for making the sameTIAWAN SEMICONDUCTOR MFG CO LT·Filed 2004·Granted Oct 28, 2008·24 cites·22 claims
3475US11665897B2Improving surface topography by forming spacer-like componentsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted May 30, 2023·0 cites·20 claims
3575US11056440B2Methods of manufacturing semiconductor device and semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 6, 2021·1 cites·20 claims
3675US9917006B1Method of planarizating filmTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 13, 2018·2 cites·20 claims
3774US11489115B2VIA structure and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Nov 1, 2022·0 cites·20 claims
3874US8178422B2Method of measurement in semiconductor fabricationHSU ALEX·Filed 2009·Granted May 15, 2012·4 cites·20 claims
3972US11996432B2Image sensor device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted May 28, 2024·0 cites·20 claims
4072US11538837B2Semiconductor imaging device having improved dark current performanceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Dec 27, 2022·0 cites·20 claims
4171US11004880B2Semiconductor imaging device having improved dark current performanceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted May 11, 2021·0 cites·20 claims
4270US11086221B2Method of using a surfactant-containing shrinkage material to prevent photoresist pattern collapse caused by capillary forcesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 10, 2021·0 cites·20 claims
4370US9196646B2Method for reducing crosstalk in image sensors using implant technologyTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 24, 2015·0 cites·20 claims
4469US12456649B2Semiconductor device and methods of manufacturing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Oct 28, 2025·0 cites·20 claims
4569US11502044B2Methods of manufacturing semiconductor device and semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Nov 15, 2022·0 cites·20 claims
4666US8466070B2Methods of forming semiconductor structuresCHOU HSING-FEI·Filed 2011·Granted Jun 18, 2013·2 cites·20 claims
4765US11276699B2Surface topography by forming spacer-like componentsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Mar 15, 2022·0 cites·20 claims
4865US10998498B2VIA structure and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted May 4, 2021·0 cites·20 claims
4965US2022285203A1Double patterning techniques for forming a deep trench isolation structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Application pending·0 cites
5064US10910260B2Method for manufacturing semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Feb 2, 2021·0 cites·20 claims

Showing the top 50 of 62 patent records by PatentIndex Score.

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →