Inventor · disambiguated record
Fei Yuan
Also filed as: YUAN FEI
9 granted patents·2 pending applications·35 citations·filing 2011–2023
79Inventor score
Files withBOE TECHNOLOGY GROUP CO LTD5AMAZON TECH INC2YUAN FEI2ALIBABA GROUP HOLDING LTD1DELL PRODUCTS LP1
Top patents by PatentIndex Score
11 records- 0189US11599813B1Interactive workflow generation for machine learning lifecycle managementAMAZON TECH INC·Filed 2019·Granted Mar 7, 2023·32 cites·20 claims
- 0271US12033195B1E-commerce document framework with cross-source and cross-document validationAMAZON TECH INC·Filed 2021·Granted Jul 9, 2024·1 cites·20 claims
- 0351US9240849B2Apparatus and method for detecting faulty antennasYUAN FEI·Filed 2011·Granted Jan 19, 2016·1 cites·20 claims
- 0448USD1050866SCurtain holdback tieYUAN FEI·Filed 2023·Granted Nov 12, 2024·1 cites·1 claims
- 0546US11568118B2Electronic device, method for generating package drawing and computer readable storage mediumBOE TECHNOLOGY GROUP CO LTD·Filed 2020·Granted Jan 31, 2023·0 cites·14 claims
- 0643US12061935B2Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis systemBOE TECHNOLOGY GROUP CO LTD·Filed 2021·Granted Aug 13, 2024·0 cites·11 claims
- 0743US12032364B2Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis systemBOE TECHNOLOGY GROUP CO LTD·Filed 2020·Granted Jul 9, 2024·0 cites·14 claims
- 0839US11526427B2Software code testing systemDELL PRODUCTS LP·Filed 2020·Granted Dec 13, 2022·0 cites·20 claims
- 0937US2022179873A1Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysisBOE TECHNOLOGY GROUP CO LTD·Filed 2021·Application pending·0 cites
- 1036US11797557B2Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysisBOE TECHNOLOGY GROUP CO LTD·Filed 2020·Granted Oct 24, 2023·0 cites·19 claims
- 1136US2017140301A1Identifying social business characteristic userALIBABA GROUP HOLDING LTD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →