Inventor · disambiguated record
Filip Lopour
Also filed as: LOPOUR FILIP
6 granted patents·21 citations·filing 2003–2018
75Inventor score
Technology areasH01J
Top patents by PatentIndex Score
6 records- 0182US8729471B2Electron detector including an intimately-coupled scintillator-photomultiplier combination, and electron microscope and X-ray detector employing sameBARBI NICHOLAS C·Filed 2011·Granted May 20, 2014·8 cites·44 claims
- 0265US7193222B2Secondary electron detector, especially in a scanning electron microscopeTESCAN S R O·Filed 2003·Granted Mar 20, 2007·12 cites·13 claims
- 0356US10109457B2Method of specimen processing in an apparatus with two or more particle beams and apparatus for this processingTESCAN ORSAY HOLDING A S·Filed 2014·Granted Oct 23, 2018·1 cites·20 claims
- 0452US10535496B2Device with ion column and scanning electron microscopeTESCAN BRNO S R O·Filed 2018·Granted Jan 14, 2020·0 cites·12 claims
- 0544US10629412B2Apparatus with two or more particle beams for processing a specimenTESCAN ORSAY HOLDING A S·Filed 2017·Granted Apr 21, 2020·0 cites·14 claims
- 0637US10504694B2Scanning electron microscope and method of use thereofTESCAN BRNO S R O·Filed 2017·Granted Dec 10, 2019·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →