Inventor · disambiguated record
Florian Binder
Also filed as: BINDER FLORIAN
9 granted patents·2 pending applications·490 citations·filing 1992–2011
89Inventor score
Files withINFINEON TECHNOLOGIES AG2SECURETEC DETEKTIONS SYSTEME A2BINDER FLORIAN1DERTINGER STEPHAN1LEHMANN VOLKER1
Top patents by PatentIndex Score
11 records- 0194US5252294AMicromechanical structureMESSERSCHMITT BOELKOW BLOHM·Filed 1992·Granted Oct 12, 1993·332 cites·15 claims
- 0285US8581405B2Integrated circuit having a semiconductor substrate with barrier layerDERTINGER STEPHAN·Filed 2011·Granted Nov 12, 2013·11 cites·6 claims
- 0385US6514773B1Method of detecting surface contamination by an analyteSECURETEC DETEKTIONS SYSTEME A·Filed 1995·Granted Feb 4, 2003·88 cites·25 claims
- 0479US7977798B2Integrated circuit having a semiconductor substrate with a barrier layerINFINEON TECHNOLOGIES AG·Filed 2007·Granted Jul 12, 2011·8 cites·11 claims
- 0573US6605444B1Method and device for obtaining and detecting immunologically active substances from the gas phaseSECURETEC DETEKTIONS SYSTEMS A·Filed 1997·Granted Aug 12, 2003·41 cites·6 claims
- 0663US7911026B2Chip carrier with reduced interference signal sensitivityQIMONDA AG·Filed 2006·Granted Mar 22, 2011·3 cites·20 claims
- 0758US8263491B2Substrate with feedthrough and method for producing the sameBINDER FLORIAN·Filed 2007·Granted Sep 11, 2012·3 cites·17 claims
- 0846US2004023289A1Method and device for obtaining and detecting immunologically active substances from the gas phaseSECURETEC DETEKTIONS SYSTEME A·Filed 2003·Application pending·0 cites
- 0943US8048801B2Substrate with feedthrough and method for producing the sameINFINEON TECHNOLOGIES AG·Filed 2007·Granted Nov 1, 2011·0 cites·24 claims
- 1030US2008308303A1Chip carrier substrate and production method thereforLEHMANN VOLKER·Filed 2006·Application pending·0 cites
- 1127US5690529AAdsorber material, apparatus and process for concentrating and recovering trace materials from the gaseous phaseSECURETEC GMBH·Filed 1996·Granted Nov 25, 1997·4 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →