Inventor · disambiguated record
Floribertus P.M. Heukensfeldt Jansen
Also filed as: JANSEN FLORIBERTUS P M HEUKENS · JANSEN FLORIBERTUS P M HEUKENSFELDT
8 granted patents·5 pending applications·110 citations·filing 2006–2015
87Inventor score
Top patents by PatentIndex Score
13 records- 0184US7671340B2Adjustable-focal-length collimators method and systemGEN ELECTRIC·Filed 2007·Granted Mar 2, 2010·37 cites·26 claims
- 0282US7339174B1Combined slit/pinhole collimator method and systemGEN ELECTRIC·Filed 2007·Granted Mar 4, 2008·29 cites·28 claims
- 0378US8355551B2Method and apparatus for reducing image artifactsGEN ELECTRIC·Filed 2009·Granted Jan 15, 2013·9 cites·21 claims
- 0474US9129426B2Motion compensation in image processingGOPALAKRISHNAN GIRISHANKAR·Filed 2010·Granted Sep 8, 2015·6 cites·21 claims
- 0574US8552389B2System and method for collimation in diagnostic imaging systemsJANSEN FLORIBERTUS P M HEUKENSFELDT·Filed 2010·Granted Oct 8, 2013·11 cites·20 claims
- 0671US7692160B2Method and system of optical imaging for target detection in a scattering mediumGEN ELECTRIC·Filed 2007·Granted Apr 6, 2010·12 cites·21 claims
- 0771US7470907B2Cross-slit collimator method and systemGEN ELECTRIC·Filed 2006·Granted Dec 30, 2008·6 cites·28 claims
- 0848US2008304619A1Modular Multi-Hole Collimators Method and SystemGEN ELECTRIC·Filed 2007·Application pending·0 cites
- 0947US9892515B2Motion compensation in image processingGEN ELECTRIC·Filed 2015·Granted Feb 13, 2018·0 cites·17 claims
- 1044US2008004533A1Optical imaging systems and methodsGEN ELECTRIC·Filed 2006·Application pending·0 cites
- 1142US2012305781A1System and method for collimation in diagnostic imaging systemsJANSEN FLORIBERTUS P M HEUKENSFELDT·Filed 2011·Application pending·0 cites
- 1239US2012080414A1Method and system for laser patterning a semiconductor substrateZHANG WENWU·Filed 2010·Application pending·0 cites
- 1336US2013161520A1System and method for collimation in imaging systemsJANSEN FLORIBERTUS P M HEUKENSFELDT·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →