Inventor · disambiguated record
Flavio Maggioni
Also filed as: MAGGIONI FLAVIO
15 granted patents·6 pending applications·23 citations·filing 1997–2025
88Inventor score
Top patents by PatentIndex Score
21 records- 0192US11035885B2Testing head having improved frequency propertiesTECHNOPROBE SPA·Filed 2019·Granted Jun 15, 2021·4 cites·23 claims
- 0286US11971449B2Probe head for a testing apparatus of electronic devices with enhanced filtering propertiesTECHNOPROBE SPA·Filed 2021·Granted Apr 30, 2024·1 cites·27 claims
- 0385US12487253B2Large probe head for testing electronic devices and related manufacturing methodTECHNOPROBE SPA·Filed 2021·Granted Dec 2, 2025·1 cites·16 claims
- 0485US12313655B2Testing head having improved frequency propertiesTECHNOPROBE SPA·Filed 2024·Granted May 27, 2025·0 cites·16 claims
- 0584US11828774B2Testing head with improved frequency propertyTECHNOPROBE SPA·Filed 2019·Granted Nov 28, 2023·2 cites·25 claims
- 0684US2025258199A1Testing head having improved frequency propertiesTECHNOPROBE SPA·Filed 2025·Application pending·0 cites
- 0782US11921133B2Testing head having improved frequency propertiesTECHNOPROBE SPA·Filed 2023·Granted Mar 5, 2024·0 cites·30 claims
- 0875US2023324438A1Testing head with improved frequency propertyTECHNOPROBE SPA·Filed 2023·Application pending·0 cites
- 0974US11808788B2Testing head having improved frequency propertiesTECHNOPROBE SPA·Filed 2021·Granted Nov 7, 2023·0 cites·25 claims
- 1068US10761113B2Probe card for a testing apparatus of electronic devices with enhanced filtering propertiesTECHNOPROBE SPA·Filed 2017·Granted Sep 1, 2020·1 cites·26 claims
- 1164US11163004B2Probe head for a testing apparatus of electronic devices with enhanced filtering propertiesTECHNOPROBE SPA·Filed 2019·Granted Nov 2, 2021·0 cites·2 claims
- 1258US9069015B2Interface board of a testing head for a test equipment of electronic devices and corresponding probe headCAMPARDO GIOVANNI·Filed 2012·Granted Jun 30, 2015·1 cites·16 claims
- 1355US12292457B2Flexible membrane adapted to carry high-frequency (RF) power signals and corresponding probe card for the high-frequency (RF) power test of electronic devicesTECHNOPROBE SPA·Filed 2021·Granted May 6, 2025·0 cites·33 claims
- 1449US2024012028A1Large probe card for testing electronic devices and related manufacturing methodTECHNOPROBE SPA·Filed 2021·Application pending·0 cites
- 1549US2022155349A1Vertical Probe HeadTECHNOPROBE SPA·Filed 2022·Application pending·0 cites
- 1648US2024044940A1Contact probe for probe heads of electronic devicesTECHNOPROBE SPA·Filed 2021·Application pending·0 cites
- 1745US11340262B2Contact probe for a testing head for testing high-frequency devicesTECHNOPROBE SPA·Filed 2020·Granted May 24, 2022·0 cites·15 claims
- 1844US12019111B2Manufacturing method of a multi-layer for a probe cardTECHNOPROBE SPA·Filed 2019·Granted Jun 25, 2024·0 cites·20 claims
- 1940US6194909B1Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing systemCSELT CENTRO STUDI LAB TELECOM·Filed 1997·Granted Feb 27, 2001·9 cites·10 claims
- 2032US6320390B1Probe for fault actuation devicesCSELT CENTRO STUDI LAB TELECOM·Filed 1997·Granted Nov 20, 2001·4 cites·12 claims
- 2131US2005177328A1Process for the electromagnetic modelling of electronic components and systemsFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →