Inventor · disambiguated record
Freddie Erich Babian
Also filed as: BABIAN FREDDIE ERICH
7 granted patents·102 citations·filing 2013–2021
83Inventor score
Technology areasH10P
Top patents by PatentIndex Score
7 records- 0196US11688067B2Methods and systems for detecting defects in devices using X-raysBRUKER NANO INC·Filed 2020·Granted Jun 27, 2023·5 cites·17 claims
- 0296US11042981B2Methods and systems for printed circuit board design based on automatic correctionsSVXR INC·Filed 2020·Granted Jun 22, 2021·6 cites·20 claims
- 0394US9129715B2High speed x-ray inspection microscopeADLER DAVID LEWIS·Filed 2013·Granted Sep 8, 2015·78 cites·43 claims
- 0493US11651492B2Methods and systems for manufacturing printed circuit board based on x-ray inspectionBRUKER NANO INC·Filed 2020·Granted May 16, 2023·3 cites·78 claims
- 0593US9646732B2High speed X-ray microscopeSVXR INC·Filed 2016·Granted May 9, 2017·10 cites·54 claims
- 0667US11662479B2Methods and systems for printed circuit board design based on automatic correctionsBRUKER NANO INC·Filed 2021·Granted May 30, 2023·0 cites·20 claims
- 0751US12307668B2Methods and systems for defects detection and classification using X-raysBRUKER NANO INC·Filed 2020·Granted May 20, 2025·0 cites·21 claims
Join the waitlist — get patent alerts
Get an alert when Freddie Erich Babian files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →