Inventor · disambiguated record
Frederik Büchau-Vender
Also filed as: BÜCHAU-VENDER FREDERIK
1 granted patent·1 pending application·0 citations·filing 2020–2020
1Inventor score
Technology areasG01Q
Files withBRUKER NANO GMBH2
Top patents by PatentIndex Score
2 records- 0134US2022244287A1Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for OperatingBRUKER NANO GMBH·Filed 2020·Application pending·0 cites
- 0227US11656244B2Compensating control signal for raster scan of a scanning probe microscopeBRUKER NANO GMBH·Filed 2020·Granted May 23, 2023·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →