Inventor · disambiguated record
Francesca Canali
Also filed as: CANALI FRANCESCA
2 granted patents·32 citations·filing 1999–1999
61Inventor score
Files withST MICROELECTRONICS SRL2
Top patents by PatentIndex Score
2 records- 0159US6233046B1Method of measuring the thickness of a layer of silicon damaged by plasma etchingST MICROELECTRONICS SRL·Filed 1999·Granted May 15, 2001·26 cites·7 claims
- 0227US6313040B1Process for the definition of openings in a dielectric layerST MICROELECTRONICS SRL·Filed 1999·Granted Nov 6, 2001·6 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →