Inventor · disambiguated record
Franciscus G. M. De Jong
Also filed as: DE JONG FRANCISCUS G M
9 granted patents·193 citations·filing 1989–1999
90Inventor score
Files withPHILIPS CORP9
Top patents by PatentIndex Score
9 records- 0183US5430735ATesting integrated circuits provided on a carrierPHILIPS CORP·Filed 1989·Granted Jul 4, 1995·41 cites·30 claims
- 0281US5963038AMethod of testing a connection which includes a conductor in an integrated circuitPHILIPS CORP·Filed 1997·Granted Oct 5, 1999·51 cites·18 claims
- 0376US4967142AElectronic module comprising a first substrate element with a functional part, and a second substrate element for testing an interconnection function, socket, substrate element and electronic apparatus thereforPHILIPS CORP·Filed 1989·Granted Oct 30, 1990·36 cites·10 claims
- 0453US5781559ATestable circuitPHILIPS CORP·Filed 1996·Granted Jul 14, 1998·18 cites·15 claims
- 0550US6297643B2Connection test methodPHILIPS CORP·Filed 1999·Granted Oct 2, 2001·15 cites·11 claims
- 0639US5894224AMethod of testing a connection which includes a conductor in an integrated circuitPHILIPS CORP·Filed 1997·Granted Apr 13, 1999·9 cites·22 claims
- 0739US5657329ATesting integrated circuits provided on a carrierPHILIPS CORP·Filed 1995·Granted Aug 12, 1997·8 cites·17 claims
- 0838US6119256AApparatus for testing a fixed logic value interconnection between integrated circuitsPHILIPS CORP·Filed 1994·Granted Sep 12, 2000·8 cites·17 claims
- 0937US5680407ADevice for testing multiple pulling resistor connections using a single test pointPHILIPS CORP·Filed 1994·Granted Oct 21, 1997·7 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →