Inventor · disambiguated record
Franciscus Gerardus Maria De Jong
Also filed as: DE JONG FRANCISCUS G M · DE JONG FRANCISCUS GERARDUS MA · DE JONG FRANCISCUS GERARDUS MARIA
10 granted patents·174 citations·filing 1999–2004
88Inventor score
Top patents by PatentIndex Score
10 records- 0195US7619431B2High sensitivity magnetic built-in current sensorNXP BV·Filed 2004·Granted Nov 17, 2009·115 cites·21 claims
- 0270US6664798B2Integrated circuit with test interfaceKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Dec 16, 2003·17 cites·15 claims
- 0365US7380186B2Boundary scan circuit with integrated sensor for sensing physical operating parametersNXP BV·Filed 2003·Granted May 27, 2008·12 cites·16 claims
- 0465US6812690B2Integrated circuit with power supply test interfaceKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Nov 2, 2004·12 cites·13 claims
- 0556US6807505B2Circuit with interconnect test unitKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Oct 19, 2004·7 cites·9 claims
- 0640US6765403B2Test circuit and test method for protecting an IC against damage from activation of too many current drawing circuits at one timeKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Jul 20, 2004·1 cites·11 claims
- 0740US6622108B1Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuitKONINKL PHILIPS ELECTRONICS NV·Filed 1999·Granted Sep 16, 2003·7 cites·13 claims
- 0837US7199573B2Electronic circuit with test unitNXP BV·Filed 2003·Granted Apr 3, 2007·1 cites·7 claims
- 0936US6883129B2Electronic circuit and method for testingKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Apr 19, 2005·2 cites·11 claims
- 1033US7506227B2Integrated circuit with embedded identification codeNXP BV·Filed 2003·Granted Mar 17, 2009·0 cites·19 claims
Join the waitlist — get patent alerts
Get an alert when Franciscus Gerardus Maria De Jong files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →