Inventor · disambiguated record
Franklin Roy Dietz
Also filed as: DIETZ FRANKLIN ROY
3 granted patents·59 citations·filing 1998–2000
72Inventor score
Top patents by PatentIndex Score
3 records- 0172US6437868B1In-situ automated contactless thickness measurement for wafer thinningAGERE SYST GUARDIAN CORP·Filed 1999·Granted Aug 20, 2002·39 cites·30 claims
- 0264US6490033B1Method of thin film process control and calibration standard for optical profilometry step height measurementLUCENT TECHNOLOGIES INC·Filed 2000·Granted Dec 3, 2002·15 cites·24 claims
- 0335US6146909ADetecting trace levels of copperLUCENT TECHNOLOGIES INC·Filed 1998·Granted Nov 14, 2000·5 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →