Inventor · disambiguated record
Franz Haditsch
Also filed as: HADITSCH FRANZ
2 granted patents·25 citations·filing 1991–2013
53Inventor score
Technology areasG01N
Top patents by PatentIndex Score
2 records- 0150US5184070AEddy-current defect test instrument with multiple test probes and one distance probeFOERSTER INST DR FRIEDRICH·Filed 1991·Granted Feb 2, 1993·25 cites·16 claims
- 0240US9222916B2Through-coil arrangement, test apparatus with through-coil arrangement and testing methodFOERSTER INST DR GMBH & CO KG·Filed 2013·Granted Dec 29, 2015·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →