Inventor · disambiguated record
Frank Heinlein
Also filed as: HEINLEIN FRANK
2 granted patents·53 citations·filing 2001–2001
65Inventor score
Files withADVANCED MICRO DEVICES INC2
Top patents by PatentIndex Score
2 records- 0179US6365423B1Method of inspecting a depth of an opening of a dielectric material layerADVANCED MICRO DEVICES INC·Filed 2001·Granted Apr 2, 2002·35 cites·34 claims
- 0269US6720242B2Method of forming a substrate contact in a field effect transistor formed over a buried insulator layerADVANCED MICRO DEVICES INC·Filed 2001·Granted Apr 13, 2004·18 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →