Inventor · disambiguated record
Frank Hillmann
Also filed as: HILLMANN FRANK
1 granted patent·2 pending applications·0 citations·filing 2004–2005
10Inventor score
Technology areasG02B
Top patents by PatentIndex Score
3 records- 0130US7375792B2Apparatus for measuring feature widths on masks for the semiconductor industryLEICA MICROSYSTEMS·Filed 2004·Granted May 20, 2008·0 cites·22 claims
- 0227US2008259327A1Device for Inspecting a Microscopic ComponentVISTEC SEMICONDUCTOR SYS GMBH·Filed 2005·Application pending·0 cites
- 0327US2007206279A1Device for inspecting a microscopic component by means of an immersion objectiveVISTEC SEMICONDUCTOR SYS GMBH·Filed 2005·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Frank Hillmann files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →