Inventor · disambiguated record
Frank Hui
Also filed as: HUI FRANK · HUI FRANK Y · HUI FRANK YAUCHEE
17 granted patents·1 pending application·181 citations·filing 1999–2016
93Inventor score
Files withHUI FRANK5AGERE SYSTEMS INC4BROADCOM CORP4AGERE SYST GUARDIAN CORP1AVAGO TECHNOLOGIES GENERAL IP1
Top patents by PatentIndex Score
18 records- 0187US9406793B2Semiconductor device with a vertical channel formed through a plurality of semiconductor layersBROADCOM CORP·Filed 2014·Granted Aug 2, 2016·7 cites·20 claims
- 0287US6356496B1Resistor fuseLUCENT TECHNOLOGIES INC·Filed 2000·Granted Mar 12, 2002·45 cites·39 claims
- 0386US6838717B1Stacked structure for parallel capacitors and method of fabricationAGERE SYSTEMS INC·Filed 2000·Granted Jan 4, 2005·46 cites·6 claims
- 0482US8422265B2Programmable memory cell with shiftable threshold voltage transistorHUI FRANK·Filed 2011·Granted Apr 16, 2013·6 cites·20 claims
- 0577US6893883B2Method and apparatus using an on-chip ring oscillator for chip identificationAGERE SYSTEMS INC·Filed 2003·Granted May 17, 2005·26 cites·9 claims
- 0676US8363445B2One-time programmable memory cellBROADCOM CORP·Filed 2011·Granted Jan 29, 2013·4 cites·20 claims
- 0772US8816421B2Semiconductor device with semiconductor fins and floating gateHUI FRANK·Filed 2012·Granted Aug 26, 2014·4 cites·17 claims
- 0868US7180102B2Method and apparatus for using cobalt silicided polycrystalline silicon for a one time programmable non-volatile semiconductor memoryAGERE SYSTEMS INC·Filed 2003·Granted Feb 20, 2007·15 cites·21 claims
- 0963US9536883B2Dual anti-fuseHUI FRANK·Filed 2012·Granted Jan 3, 2017·2 cites·22 claims
- 1062US6570238B2Preweakened on chip metal fuse using dielectric trenches for barrier layer isolationAGERE SYSTEMS INC·Filed 2001·Granted May 27, 2003·9 cites·15 claims
- 1159US8558300B2Method for fabricating a flash memory cell utilizing a high-K metal gate process and related structureXIA WEI·Filed 2009·Granted Oct 15, 2013·1 cites·20 claims
- 1257US8050076B2One-time programmable memory cell with shiftable threshold voltage transistorBROADCOM CORP·Filed 2009·Granted Nov 1, 2011·2 cites·17 claims
- 1353US8822286B2Method of fabricating a flash memory comprising a high-K dielectric and a metal gateBROADCOM CORP·Filed 2013·Granted Sep 2, 2014·0 cites·17 claims
- 1452US9680002B2Semiconductor device with a variable-width vertical channel formed through a plurality of semiconductor layersAVAGO TECHNOLOGIES GENERAL IP·Filed 2016·Granted Jun 13, 2017·0 cites·20 claims
- 1552US9048201B2Sacrificial wafer probe pads through seal ring for electrical connection to circuit inside an integrated circuitHUI FRANK·Filed 2011·Granted Jun 2, 2015·1 cites·31 claims
- 1650US6323111B1Preweakened on chip metal fuse using dielectric trenches for barrier layer isolationAGERE SYST GUARDIAN CORP·Filed 1999·Granted Nov 27, 2001·13 cites·3 claims
- 1737US8937357B2One-time programmable semiconductor deviceHUI FRANK·Filed 2010·Granted Jan 20, 2015·0 cites·20 claims
- 1834US2006267621A1On-chip apparatus and method for determining integrated circuit stress conditionsHARRIS EDWARD B·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →