Inventor · disambiguated record
Frank Laube
Also filed as: LAUBE FRANK
2 granted patents·1 pending application·3 citations·filing 2010–2015
43Inventor score
Top patents by PatentIndex Score
3 records- 0160US9835567B2Method for monitoring the operational state of a surface inspection system for detecting defects on the surface of semiconductor wafersSILTRONIC AG·Filed 2015·Granted Dec 5, 2017·1 cites·15 claims
- 0255US8304860B2Epitaxially coated silicon wafer and method for producing an epitaxially coated silicon waferPASSEK FRIEDRICH·Filed 2010·Granted Nov 6, 2012·2 cites·20 claims
- 0329US2012007978A1Method and Apparatus For Examining A Semiconductor WaferPASSEK FRIEDRICH·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →