Inventor · disambiguated record
Franco Motika
Also filed as: MOTIKA FRANCO · MOTIKA FRANKO
118 granted patents·18 pending applications·3,696 citations·filing 1985–2020
99Inventor score
Top patents by PatentIndex Score
136 records- 0199US7128274B2Secure credit card with near field communicationsIBM·Filed 2005·Granted Oct 31, 2006·447 cites·9 claims
- 0298US6641050B2Secure credit cardIBM·Filed 2001·Granted Nov 4, 2003·521 cites·11 claims
- 0396US9588177B1Optimizing generation of test configurations for built-in self-testingIBM·Filed 2016·Granted Mar 7, 2017·17 cites·20 claims
- 0496US7007380B2TFI probe I/O wrap test methodIBM·Filed 2004·Granted Mar 7, 2006·111 cites·5 claims
- 0596US5841435AVirtual windows desktopIBM·Filed 1996·Granted Nov 24, 1998·291 cites·5 claims
- 0696US4801870AWeighted random pattern testing apparatus and methodIBM·Filed 1988·Granted Jan 31, 1989·154 cites·4 claims
- 0795US6327685B1Logic built-in self testIBM·Filed 1999·Granted Dec 4, 2001·130 cites·8 claims
- 0894US9552449B1Dynamic fault model generation for diagnostics simulation and pattern generationIBM·Filed 2016·Granted Jan 24, 2017·6 cites·18 claims
- 0994US7175073B2Secure cell phone for ATM transactionsIBM·Filed 2005·Granted Feb 13, 2007·50 cites·20 claims
- 1094US4687988AWeighted random pattern testing apparatus and methodIBM·Filed 1985·Granted Aug 18, 1987·133 cites·3 claims
- 1193US8875261B2Rules driven multiple passwordsDELIA WAYNE M·Filed 2008·Granted Oct 28, 2014·28 cites·7 claims
- 1292US7845005B2Method for preventing malicious software installation on an internet-connected computerIBM·Filed 2006·Granted Nov 30, 2010·30 cites·18 claims
- 1392US6961886B2Diagnostic method for structural scan chain designsIBM·Filed 2003·Granted Nov 1, 2005·59 cites·19 claims
- 1492US5983380AWeighted random pattern built-in self-testIBM·Filed 1997·Granted Nov 9, 1999·131 cites·20 claims
- 1591US7257745B2Array self repair using built-in self test techniquesIBM·Filed 2005·Granted Aug 14, 2007·22 cites·14 claims
- 1691US6516432B1AC scan diagnostic methodIBM·Filed 1999·Granted Feb 4, 2003·103 cites·16 claims
- 1791US6442723B1Logic built-in self test selective signature generationIBM·Filed 1999·Granted Aug 27, 2002·84 cites·24 claims
- 1890US6883717B1Secure credit card employing pseudo-random bit sequences for authenticationIBM·Filed 2004·Granted Apr 26, 2005·52 cites·35 claims
- 1990US6308290B1Look ahead scan chain diagnostic methodIBM·Filed 1999·Granted Oct 23, 2001·80 cites·6 claims
- 2089US9852245B2Dynamic fault model generation for diagnostics simulation and pattern generationIBM·Filed 2017·Granted Dec 26, 2017·3 cites·20 claims
- 2189US8791822B2Embedded RFID verifiable currencyDELIA WAYNE M·Filed 2008·Granted Jul 29, 2014·15 cites·19 claims
- 2289US8136082B2Method for testing integrated circuitsDESINENI RAO H·Filed 2011·Granted Mar 13, 2012·9 cites·16 claims
- 2389US5982189ABuilt-in dynamic stress for integrated circuitsIBM·Filed 1997·Granted Nov 9, 1999·89 cites·19 claims
- 2488US9231981B2Rules driven multiple passwordsIBM·Filed 2014·Granted Jan 5, 2016·8 cites·25 claims
- 2588US6490702B1Scan structure for improving transition fault coverage and scan diagnosticsIBM·Filed 1999·Granted Dec 3, 2002·72 cites·11 claims
- 2687US10024910B2Iterative N-detect based logic diagnostic techniqueIBM·Filed 2016·Granted Jul 17, 2018·3 cites·20 claims
- 2787US4745355AWeighted random pattern testing apparatus and methodIBM·Filed 1987·Granted May 17, 1988·58 cites·6 claims
- 2886US8840030B2Secure credit card with near field communicationsKELLEY EDWARD E·Filed 2006·Granted Sep 23, 2014·11 cites·12 claims
- 2986US8843797B2Signature compression register instability isolation and stable signature mask generation for testing VLSI chipsMOTIKA FRANCO·Filed 2012·Granted Sep 23, 2014·9 cites·19 claims
- 3086US7971176B2Method for testing integrated circuitsIBM·Filed 2008·Granted Jun 28, 2011·13 cites·10 claims
- 3185US9857422B2Methods and systems for generating functional test patterns for manufacture testIBM·Filed 2016·Granted Jan 2, 2018·2 cites·13 claims
- 3285US7480882B1Measuring and predicting VLSI chip reliability and failureIBM·Filed 2008·Granted Jan 20, 2009·14 cites·1 claims
- 3385US6971054B2Method and system for determining repeatable yield detractors of integrated circuitsIBM·Filed 2002·Granted Nov 29, 2005·36 cites·37 claims
- 3485US4688223AWeighted random pattern testing apparatus and methodIBM·Filed 1985·Granted Aug 18, 1987·49 cites·3 claims
- 3584US10365132B2Methods and systems for performing test and calibration of integrated sensorsIBM·Filed 2018·Granted Jul 30, 2019·2 cites·7 claims
- 3684US8095519B2Multifactor authentication with changing unique valuesDELIA WAYNE M·Filed 2008·Granted Jan 10, 2012·13 cites·10 claims
- 3783US8769360B2Dynamic detection and identification of the functional state of multi-processor coresMOTIKA FRANCO·Filed 2010·Granted Jul 1, 2014·8 cites·25 claims
- 3882US9286605B2Secure credit card with near field communicationsEBAY INC·Filed 2014·Granted Mar 15, 2016·2 cites·20 claims
- 3982US8566751B2GUI pointer automatic position vectoringKELLEY EDWARD E·Filed 2005·Granted Oct 22, 2013·11 cites·18 claims
- 4081US7536642B2Method for monitoring computer user inputIBM·Filed 2005·Granted May 19, 2009·11 cites·5 claims
- 4181US7128273B2Secure credit card adapterIBM·Filed 2005·Granted Oct 31, 2006·8 cites·13 claims
- 4281US7010735B2Stuck-at fault scan chain diagnostic methodIBM·Filed 2002·Granted Mar 7, 2006·31 cites·14 claims
- 4380US8291470B2Conditional supplemental passwordDELIA WAYNE M·Filed 2008·Granted Oct 16, 2012·9 cites·18 claims
- 4480US7669057B2Secure computer password system and methodIBM·Filed 2005·Granted Feb 23, 2010·9 cites·18 claims
- 4579US7908534B2Diagnosable general purpose test registers scan chain designIBM·Filed 2008·Granted Mar 15, 2011·9 cites·6 claims
- 4679US6865501B2Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collectionIBM·Filed 2003·Granted Mar 8, 2005·16 cites·7 claims
- 4779US6671644B2Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collectionIBM·Filed 2001·Granted Dec 30, 2003·15 cites·22 claims
- 4878US10209306B2Methods and systems for generating functional test patterns for manufacture testIBM·Filed 2017·Granted Feb 19, 2019·1 cites·20 claims
- 4978US7759960B2Integrated circuit testing methods using well bias modificationIBM·Filed 2008·Granted Jul 20, 2010·7 cites·24 claims
- 5078US6731128B2TFI probe I/O wrap test methodIBM·Filed 2002·Granted May 4, 2004·17 cites·10 claims
Showing the top 50 of 136 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →