Inventor · disambiguated record
Franco Stellari
Also filed as: STELLARI FRANCO
69 granted patents·4 pending applications·245 citations·filing 2004–2022
98Inventor score
Top patents by PatentIndex Score
73 records- 0195US8115170B2Method and apparatus for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning systemSTELLARI FRANCO·Filed 2007·Granted Feb 14, 2012·57 cites·34 claims
- 0292US9568540B2Method for the characterization and monitoring of integrated circuitsIBM·Filed 2014·Granted Feb 14, 2017·7 cites·13 claims
- 0391US11715195B2Machine learning-based circuit board inspectionIBM·Filed 2021·Granted Aug 1, 2023·2 cites·17 claims
- 0491US8635582B2Navigating analytical tools using layout softwareSTELLARI FRANCO·Filed 2012·Granted Jan 21, 2014·13 cites·11 claims
- 0587US11508438B1RRAM filament location based on NIR emissionIBM·Filed 2020·Granted Nov 22, 2022·2 cites·20 claims
- 0687US9874601B2Integrated time dependent dielectric breakdown reliability testingIBM·Filed 2016·Granted Jan 23, 2018·2 cites·19 claims
- 0787US8750595B2Registering measured images to layout dataSTELLARI FRANCO·Filed 2010·Granted Jun 10, 2014·10 cites·18 claims
- 0886US8131056B2Constructing variability maps by correlating off-state leakage emission images to layout informationPOLONSKY STANISLAV·Filed 2008·Granted Mar 6, 2012·11 cites·25 claims
- 0985US9261561B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2015·Granted Feb 16, 2016·2 cites·20 claims
- 1085US8041437B2System and method for virtual control of laboratory equipmentIBM·Filed 2008·Granted Oct 18, 2011·15 cites·22 claims
- 1185US7480882B1Measuring and predicting VLSI chip reliability and failureIBM·Filed 2008·Granted Jan 20, 2009·14 cites·1 claims
- 1284US10302697B2Automated scan chain diagnostics using emissionIBM·Filed 2015·Granted May 28, 2019·3 cites·19 claims
- 1384US9081049B2Minimum-spacing circuit design and layout for PICAIBM·Filed 2013·Granted Jul 14, 2015·4 cites·29 claims
- 1483US8331726B2Creating emission images of integrated circuitsSTELLARI FRANCO·Filed 2009·Granted Dec 11, 2012·12 cites·25 claims
- 1583US7446550B2Enhanced signal observability for circuit analysisIBM·Filed 2007·Granted Nov 4, 2008·10 cites·14 claims
- 1682US10591539B2Automated scan chain diagnostics using emissionIBM·Filed 2019·Granted Mar 17, 2020·1 cites·20 claims
- 1782US8312413B2Navigating analytical tools using layout softwareSTELLARI FRANCO·Filed 2010·Granted Nov 13, 2012·6 cites·11 claims
- 1881US10515183B2Integrated circuit identificationIBM·Filed 2017·Granted Dec 24, 2019·2 cites·11 claims
- 1981US7868606B2Process variation on-chip sensorIBM·Filed 2008·Granted Jan 11, 2011·8 cites·20 claims
- 2080US10515181B2Integrated circuit identificationIBM·Filed 2017·Granted Dec 24, 2019·2 cites·15 claims
- 2180US10429433B2Method for the characterization and monitoring of integrated circuitsIBM·Filed 2016·Granted Oct 1, 2019·1 cites·20 claims
- 2280US7378859B2System and method for estimation of integrated circuit signal characteristics using optical measurementsIBM·Filed 2005·Granted May 27, 2008·9 cites·10 claims
- 2378US10379152B2Method for the characterization and monitoring of integrated circuitsIBM·Filed 2016·Granted Aug 13, 2019·1 cites·12 claims
- 2478US7788058B2Method and apparatus for diagnosing broken scan chain based on leakage light emissionIBM·Filed 2008·Granted Aug 31, 2010·7 cites·24 claims
- 2576US10102090B2Non-destructive analysis to determine use history of processorIBM·Filed 2016·Granted Oct 16, 2018·2 cites·20 claims
- 2675US9581642B2Method and system for quickly identifying circuit components in an emission imageSONG PEILIN·Filed 2010·Granted Feb 28, 2017·3 cites·22 claims
- 2774US9448277B2Integrated time dependent dielectric breakdown reliability testingCHEN JIFENG·Filed 2012·Granted Sep 20, 2016·2 cites·7 claims
- 2874US8412993B2Self-adjusting critical path timing of multi-core VLSI chipSONG PEILIN·Filed 2010·Granted Apr 2, 2013·4 cites·24 claims
- 2973US10147175B2Detection of hardware trojan using light emissions with sacrificial maskIBM·Filed 2017·Granted Dec 4, 2018·2 cites·20 claims
- 3071US10928448B2Automated scan chain diagnostics using emissionIBM·Filed 2019·Granted Feb 23, 2021·0 cites·20 claims
- 3169US11169200B2Method for the characterization and monitoring of integrated circuitsIBM·Filed 2019·Granted Nov 9, 2021·0 cites·20 claims
- 3269US11061063B2Method for the characterization and monitoring of integrated circuitsIBM·Filed 2019·Granted Jul 13, 2021·0 cites·20 claims
- 3369US9086457B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2013·Granted Jul 21, 2015·1 cites·20 claims
- 3468US9075106B2Detecting chip alterations with light emissionBERNSTEIN KERRY·Filed 2009·Granted Jul 7, 2015·5 cites·19 claims
- 3567US11864474B2ReRAM analog PUF using filament locationIBM·Filed 2022·Granted Jan 2, 2024·0 cites·20 claims
- 3666US11106764B2Integrated circuit identificationIBM·Filed 2019·Granted Aug 31, 2021·0 cites·20 claims
- 3766US11036832B2Integrated circuit identificationIBM·Filed 2019·Granted Jun 15, 2021·0 cites·20 claims
- 3865US7239157B2Optical trigger for PICA techniqueIBM·Filed 2005·Granted Jul 3, 2007·4 cites·9 claims
- 3964US9229044B2Minimum-spacing circuit design and layout for PICAAINSPAN HERSCHEL A·Filed 2012·Granted Jan 5, 2016·1 cites·21 claims
- 4062US10571520B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2017·Granted Feb 25, 2020·0 cites·20 claims
- 4162US10564213B2Dielectric breakdown monitorIBM·Filed 2017·Granted Feb 18, 2020·1 cites·20 claims
- 4262US9939486B2Integrated time dependent dielectric breakdown reliability testingIBM·Filed 2017·Granted Apr 10, 2018·0 cites·19 claims
- 4361US7612571B2System and method for estimation of integrated circuit signal characteristics using optical measurementsIBM·Filed 2008·Granted Nov 3, 2009·2 cites·20 claims
- 4461US7154287B2Method and apparatus for light-controlled circuit characterizationIBM·Filed 2005·Granted Dec 26, 2006·3 cites·20 claims
- 4560US9678152B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2016·Granted Jun 13, 2017·0 cites·20 claims
- 4660US7927898B2Apparatus and methods for packaging electronic devices for optical testingIBM·Filed 2009·Granted Apr 19, 2011·2 cites·9 claims
- 4759US11480612B2Scanning methods for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning systemIBM·Filed 2019·Granted Oct 25, 2022·0 cites·18 claims
- 4859US9372231B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2015·Granted Jun 21, 2016·0 cites·20 claims
- 4958US11844293B2Physical unclonable function device with phase changeIBM·Filed 2021·Granted Dec 12, 2023·0 cites·18 claims
- 5058US11538147B2Using photonic emission to develop electromagnetic emission modelsIBM·Filed 2019·Granted Dec 27, 2022·0 cites·19 claims
Showing the top 50 of 73 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →