Inventor · disambiguated record
Frederick A. Stevie
Also filed as: STEVIE FREDERICK A
9 granted patents·122 citations·filing 1998–2000
88Inventor score
Top patents by PatentIndex Score
9 records- 0176US6250143B1Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-sectionAGERE SYST GUARDIAN CORP·Filed 1999·Granted Jun 26, 2001·50 cites·12 claims
- 0266US6519542B1Method of testing an unknown sample with an analytical toolAGERE SYSTEMS INC·Filed 2000·Granted Feb 11, 2003·9 cites·23 claims
- 0366US6519543B1Calibration method for quantitative elemental analysisAGERE SYSTEMS INC·Filed 2000·Granted Feb 11, 2003·11 cites·22 claims
- 0465US6603119B1Calibration method for quantitative elemental analysisAGERE SYSTEMS INC·Filed 2000·Granted Aug 5, 2003·6 cites·23 claims
- 0552US6297503B1Method of detecting semiconductor defectsLUCENT TECHNOLOGIES INC·Filed 1999·Granted Oct 2, 2001·16 cites·22 claims
- 0650US6362475B1Scanning electron microscope/energy dispersive spectroscopy sample preparation method and sample produced therebyAGERE SYST GUARDIAN CORP·Filed 1999·Granted Mar 26, 2002·14 cites·20 claims
- 0744US6121624AMethod for controlled implantation of elements into the surface or near surface of a substrateLUCENT TECHNOLOGIES INC·Filed 1998·Granted Sep 19, 2000·14 cites·14 claims
- 0835US6425189B1Probe tip locator having improved marker arrangement for reduced bit encoding errorAGERE SYST GUARDIAN CORP·Filed 2000·Granted Jul 30, 2002·0 cites·21 claims
- 0925US6229141B1Analysis of alkali elements in insulators using secondary ion mass spectrometryLUCENT TECHNOLOGIES INC·Filed 1998·Granted May 8, 2001·2 cites·37 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →